Bing-Siang Chao

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Hsinchu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Optical mode optimization for wafer inspection
- Patent number 12,204,842
- Issue date Jan 21, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Bing-Siang Chao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical mode optimization for wafer inspection
- Patent number 11,748,551
- Issue date Sep 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Bing-Siang Chao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical mode optimization for wafer inspection
- Patent number 11,347,926
- Issue date May 31, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Bing-Siang Chao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical mode optimization for wafer inspection
- Patent number 10,867,108
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Bing-Siang Chao
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Optical Mode Optimization for Wafer Inspection
- Publication number 20230367951
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Bing-Siang Chao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical Mode Optimization for Wafer Inspection
- Publication number 20220284167
- Publication date Sep 8, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Bing-Siang Chao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical Mode Optimization for Wafer Inspection
- Publication number 20210097226
- Publication date Apr 1, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Bing-Siang Chao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical Mode Optimization for Wafer Inspection
- Publication number 20200089130
- Publication date Mar 19, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Bing-Siang Chao
- G06 - COMPUTING CALCULATING COUNTING