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Binh Vo
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Automatic test pattern generation system for programmable logic dev...
Patent number
8,516,322
Issue date
Aug 20, 2013
Altera Corporation
Jayabrata Ghosh Dastidar
G01 - MEASURING TESTING
Information
Patent Grant
Functional failure analysis techniques for programmable integrated...
Patent number
7,685,485
Issue date
Mar 23, 2010
Altera Corporation
Binh Vo
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for semiconductor device characterization pattern...
Patent number
7,571,412
Issue date
Aug 4, 2009
Altera Corporation
Hung Hing Anthony Pang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Techniques for automatically generating tests for programmable circ...
Patent number
7,024,327
Issue date
Apr 4, 2006
Altera Corporation
Jayabrata Ghosh Dastidar
G01 - MEASURING TESTING
Information
Patent Grant
Electrophoresis method and apparatus for separating bio-organic mol...
Patent number
6,171,463
Issue date
Jan 9, 2001
The Perkin-Elmer Corporation
Barton G. Selby
G01 - MEASURING TESTING
Information
Patent Grant
Electrophoresis method and apparatus for separating bio-organic mol...
Patent number
5,993,628
Issue date
Nov 30, 1999
The Perkin-Elmer Corporation
Barton G. Selby
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Functional failure analysis techniques for programmable integrated...
Publication number
20050022085
Publication date
Jan 27, 2005
Altera Corporation
Binh Vo
G01 - MEASURING TESTING