Biow-Hiem Ong

Person

Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and memory device including conductive lines and contacts...
- Patent number 11,990,367
- Issue date May 21, 2024
- Xiaosong Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for fabricating microelectronic devices with contacts to co...
- Patent number 11,967,556
- Issue date Apr 23, 2024
- Biow Hiem Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for fabricating microelectronic devices with contacts to co...
- Patent number 11,158,577
- Issue date Oct 26, 2021
- Micron Technology, Inc.
- Biow Hiem Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus comprising structures including contact vias and conducti...
- Patent number 11,101,171
- Issue date Aug 24, 2021
- Micron Technology, Inc.
- Xiaosong Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods eliminating false defect detections
- Patent number 9,689,805
- Issue date Jun 27, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Biow-Hiem Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods eliminating false defect detections
- Patent number 9,063,097
- Issue date Jun 23, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Biow-Hiem Ong
- G01 - MEASURING TESTING
Information Patent Grant
Rendered database image-to-inspection image optimization for inspec...
- Patent number 8,818,072
- Issue date Aug 26, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Biow-Hiem Ong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Contamination inspection
- Patent number 8,629,407
- Issue date Jan 14, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Hung Lai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MICROELECTRONIC DEVICES INCLUDING CONTACT STRUCTURES, AND RELATED E...
- Publication number 20240321741
- Publication date Sep 26, 2024
- Micron Technology, Inc.
- Zhou Xuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROELECTRONIC DEVICES WITH CONDUCTIVE EXTENSIONS BETWEEN UPPER ST...
- Publication number 20240274538
- Publication date Aug 15, 2024
- Lodestar Licensing Group LLC
- Biow Hiem Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUSES AND MEMORY DEVICES INCLUDING CONDUCTIVE LINES AND INTER...
- Publication number 20240266214
- Publication date Aug 8, 2024
- Lodestar Licensing Group LLC
- Xiaosong Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROELECTRONIC DEVICES INCLUDING STAIR STEP STRUCTURES, AND RELATE...
- Publication number 20230063178
- Publication date Mar 2, 2023
- Micron Technology, Inc.
- Bo Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FABRICATING MICROELECTRONIC DEVICES WITH CONTACTS TO CO...
- Publication number 20220045007
- Publication date Feb 10, 2022
- Micron Technology, Inc.
- Biow Hiem Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS INCLUDING CONDUCTIVE LINES AND CONTACTS, AND RELATED METH...
- Publication number 20210375670
- Publication date Dec 2, 2021
- Micron Technology, Inc.
- Xiaosong Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FABRICATING MICROELECTRONIC DEVICES WITH CONTACTS TO CO...
- Publication number 20210242131
- Publication date Aug 5, 2021
- Micron Technology, Inc.
- Biow Hiem Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS COMPRISING STRUCTURES INCLUDING CONTACT VIAS AND CONDUCTI...
- Publication number 20210050252
- Publication date Feb 18, 2021
- Micron Technology, Inc.
- Xiaosong Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods Eliminating False Defect Detections
- Publication number 20150316489
- Publication date Nov 5, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Biow-Hiem Ong
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINATION INSPECTION
- Publication number 20120261563
- Publication date Oct 18, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Hung Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods Eliminating False Defect Detections
- Publication number 20120207381
- Publication date Aug 16, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Biow-Hiem Ong
- G01 - MEASURING TESTING
Information Patent Application
RENDERED DATABASE IMAGE-TO-INSPECTION IMAGE OPTIMIZATION FOR INSPEC...
- Publication number 20120051621
- Publication date Mar 1, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Biow-Hiem Ong
- G06 - COMPUTING CALCULATING COUNTING

Biow-Hiem Ong

Person

Patents Grantslast 30 patents

Apparatus and memory device including conductive lines and contacts...

Methods for fabricating microelectronic devices with contacts to co...

Methods for fabricating microelectronic devices with contacts to co...

Apparatus comprising structures including contact vias and conducti...

Systems and methods eliminating false defect detections

Systems and methods eliminating false defect detections

Rendered database image-to-inspection image optimization for inspec...

Contamination inspection

Patents Applicationslast 30 patents

MICROELECTRONIC DEVICES INCLUDING CONTACT STRUCTURES, AND RELATED E...

MICROELECTRONIC DEVICES WITH CONDUCTIVE EXTENSIONS BETWEEN UPPER ST...

APPARATUSES AND MEMORY DEVICES INCLUDING CONDUCTIVE LINES AND INTER...

MICROELECTRONIC DEVICES INCLUDING STAIR STEP STRUCTURES, AND RELATE...

METHODS FOR FABRICATING MICROELECTRONIC DEVICES WITH CONTACTS TO CO...

APPARATUS INCLUDING CONDUCTIVE LINES AND CONTACTS, AND RELATED METH...

METHODS FOR FABRICATING MICROELECTRONIC DEVICES WITH CONTACTS TO CO...

APPARATUS COMPRISING STRUCTURES INCLUDING CONTACT VIAS AND CONDUCTI...

Systems and Methods Eliminating False Defect Detections

CONTAMINATION INSPECTION

Systems and Methods Eliminating False Defect Detections

RENDERED DATABASE IMAGE-TO-INSPECTION IMAGE OPTIMIZATION FOR INSPEC...