Bjorn Brauer

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Image contrast metrics for deriving and improving imaging conditions
- Patent number 12,056,867
- Issue date Aug 6, 2024
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep generative model-based alignment for semiconductor applications
- Patent number 11,983,865
- Issue date May 14, 2024
- KLA Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generative adversarial networks (GANs) for simulating specimen images
- Patent number 11,961,219
- Issue date Apr 16, 2024
- KLA Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Setting up inspection of a specimen
- Patent number 11,748,872
- Issue date Sep 5, 2023
- KLA Corp.
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cross layer common-unique analysis for nuisance filtering
- Patent number 11,694,327
- Issue date Jul 4, 2023
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selecting defect detection methods for inspection of a specimen
- Patent number 11,619,592
- Issue date Apr 4, 2023
- KLA Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clustering sub-care areas based on noise characteristics
- Patent number 11,615,993
- Issue date Mar 28, 2023
- KLA Corporation
- Boshi Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-imaging mode image alignment
- Patent number 11,580,650
- Issue date Feb 14, 2023
- KLA Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspection using tensor decomposition and sin...
- Patent number 11,431,976
- Issue date Aug 30, 2022
- KLA Corporation
- Nurmohammed Patwary
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Statistical learning-based mode selection for multi-mode inspection
- Patent number 11,415,531
- Issue date Aug 16, 2022
- KLA Corp.
- Vaibhav Gaind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlling a process for inspection of a specimen
- Patent number 11,416,982
- Issue date Aug 16, 2022
- KLA Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Print check repeater defect detection
- Patent number 11,328,411
- Issue date May 10, 2022
- KLA Corp.
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image alignment setup for specimens with intra- and inter-specimen...
- Patent number 11,328,435
- Issue date May 10, 2022
- KLA Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep generative models for optical or other mode selection
- Patent number 11,328,410
- Issue date May 10, 2022
- KLA Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Repeater defect detection
- Patent number 11,204,332
- Issue date Dec 21, 2021
- KLA-Tencor Corporation
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cross layer common-unique analysis for nuisance filtering
- Patent number 11,151,711
- Issue date Oct 19, 2021
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unsupervised learning-based reference selection for enhanced defect...
- Patent number 11,120,546
- Issue date Sep 14, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern-to-design alignment for one-dimensional unique structures
- Patent number 11,113,827
- Issue date Sep 7, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect-location determination using correction loop for pixel align...
- Patent number 11,049,745
- Issue date Jun 29, 2021
- KLA Corporation
- David Dowling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical-mode selection for multi-mode semiconductor inspection
- Patent number 11,010,885
- Issue date May 18, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combining simulation and optical microscopy to determine inspection...
- Patent number 10,964,016
- Issue date Mar 30, 2021
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect classification by fitting optical signals to a point-spread...
- Patent number 10,957,035
- Issue date Mar 23, 2021
- KLA Corporation
- Soren Konecky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
File selection for test image to design alignment
- Patent number 10,922,808
- Issue date Feb 16, 2021
- KLA-Tencor Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Previous layer nuisance reduction through oblique illumination
- Patent number 10,818,005
- Issue date Oct 27, 2020
- KLA-Tencor Corp.
- Jingshan Zhong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Algorithm selector based on image frames
- Patent number 10,801,968
- Issue date Oct 13, 2020
- KLA-Tencor Corporation
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Grant
Training a learning based defect classifier
- Patent number 10,713,534
- Issue date Jul 14, 2020
- KLA-Tencor Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performance monitoring of design-based alignment
- Patent number 10,698,325
- Issue date Jun 30, 2020
- KLA-Tencor Corporation
- Bjorn Brauer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Repeater defect detection
- Patent number 10,648,925
- Issue date May 12, 2020
- KLA-Tencor Corporation
- Eugene Shifrin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identifying a source of nuisance defects on a wafer
- Patent number 10,620,135
- Issue date Apr 14, 2020
- KLA-Tencor Corp.
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Grant
Nuisance reduction using location-based attributes
- Patent number 10,600,177
- Issue date Mar 24, 2020
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER ALIGNMENT IMPROVEMENT THROUGH IMAGE PROJECTION-BASED PATCH-TO...
- Publication number 20230075297
- Publication date Mar 9, 2023
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE CONTRAST METRICS FOR DERIVING AND IMPROVING IMAGING CONDITIONS
- Publication number 20220405903
- Publication date Dec 22, 2022
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP GENERATIVE MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS
- Publication number 20220375051
- Publication date Nov 24, 2022
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMANTIC IMAGE SEGMENTATION FOR SEMICONDUCTOR-BASED APPLICATIONS
- Publication number 20220318986
- Publication date Oct 6, 2022
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Setting Up Inspection of a Specimen
- Publication number 20220067898
- Publication date Mar 3, 2022
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP GENERATIVE MODELS FOR OPTICAL OR OTHER MODE SELECTION
- Publication number 20220036539
- Publication date Feb 3, 2022
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CROSS LAYER COMMON-UNIQUE ANALYSIS FOR NUISANCE FILTERING
- Publication number 20220012866
- Publication date Jan 13, 2022
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ALIGNMENT SETUP FOR SPECIMENS WITH INTRA- AND INTER-SPECIMEN...
- Publication number 20210383557
- Publication date Dec 9, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRINT CHECK REPEATER DEFECT DETECTION
- Publication number 20210342992
- Publication date Nov 4, 2021
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATIVE ADVERSARIAL NETWORKS (GANs) FOR SIMULATING SPECIMEN IMAGES
- Publication number 20210272273
- Publication date Sep 2, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Clustering Sub-Care Areas Based on Noise Characteristics
- Publication number 20210159127
- Publication date May 27, 2021
- KLA Corporation
- Boshi Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STATISTICAL LEARNING-BASED MODE SELECTION FOR MULTI-MODE INSPECTION
- Publication number 20210109041
- Publication date Apr 15, 2021
- KLA Corporation
- Vaibhav Gaind
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING A PROCESS FOR INSPECTION OF A SPECIMEN
- Publication number 20210097666
- Publication date Apr 1, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-IMAGING MODE IMAGE ALIGNMENT
- Publication number 20210097704
- Publication date Apr 1, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Unsupervised Learning-Based Reference Selection for Enhanced Defect...
- Publication number 20210090229
- Publication date Mar 25, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN-TO-DESIGN ALIGNMENT FOR ONE-DIMENSIONAL UNIQUE STRUCTURES
- Publication number 20210090271
- Publication date Mar 25, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR SELECTING DEFECT DETECTION METHODS FOR INSP...
- Publication number 20210010945
- Publication date Jan 14, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN FILE SELECTION FOR TEST IMAGE TO DESIGN ALIGNMENT
- Publication number 20200265574
- Publication date Aug 20, 2020
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Repeater Defect Detection
- Publication number 20200240928
- Publication date Jul 30, 2020
- KLA-Tencor Corporation
- Eugene Shifrin
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Inspection Using Tensor Decomposition and Sin...
- Publication number 20200244963
- Publication date Jul 30, 2020
- KLA Corporation
- Nurmohammed Patwary
- G01 - MEASURING TESTING
Information Patent Application
Optical-Mode Selection for Multi-Mode Semiconductor Inspection
- Publication number 20200193588
- Publication date Jun 18, 2020
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Classification by Fitting Optical Signals to a Point-Spread...
- Publication number 20200175664
- Publication date Jun 4, 2020
- KLA-Tencor Corporation
- Soren Konecky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALGORITHM SELECTOR BASED ON IMAGE FRAMES
- Publication number 20200132610
- Publication date Apr 30, 2020
- KLA-Tencor Corporation
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Application
Defect-Location Determination Using Correction Loop for Pixel Align...
- Publication number 20200126830
- Publication date Apr 23, 2020
- KLA-Tencor Corporation
- David Dowling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CROSS LAYER COMMON-UNIQUE ANALYSIS FOR NUISANCE FILTERING
- Publication number 20190378260
- Publication date Dec 12, 2019
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PERFORMANCE MONITORING OF DESIGN-BASED ALIGNMENT
- Publication number 20190361363
- Publication date Nov 28, 2019
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Capture of Repeater Defects on a Semiconductor Wafer
- Publication number 20190346376
- Publication date Nov 14, 2019
- KLA-Tencor Corporation
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Application
COMBINING SIMULATION AND OPTICAL MICROSCOPY TO DETERMINE INSPECTION...
- Publication number 20190287232
- Publication date Sep 19, 2019
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PREVIOUS LAYER NUISANCE REDUCTION THROUGH OBLIQUE ILLUMINATION
- Publication number 20190279357
- Publication date Sep 12, 2019
- KLA-Tencor Corporation
- Jingshan Zhong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Training a Learning Based Defect Classifier
- Publication number 20190073566
- Publication date Mar 7, 2019
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING

Bjorn Brauer

Person

Patents Grantslast 30 patents

Image contrast metrics for deriving and improving imaging conditions

Deep generative model-based alignment for semiconductor applications

Generative adversarial networks (GANs) for simulating specimen images

Setting up inspection of a specimen

Cross layer common-unique analysis for nuisance filtering

Selecting defect detection methods for inspection of a specimen

Clustering sub-care areas based on noise characteristics

Multi-imaging mode image alignment

System and method for inspection using tensor decomposition and sin...

Statistical learning-based mode selection for multi-mode inspection

Controlling a process for inspection of a specimen

Print check repeater defect detection

Image alignment setup for specimens with intra- and inter-specimen...

Deep generative models for optical or other mode selection

Repeater defect detection

Cross layer common-unique analysis for nuisance filtering

Unsupervised learning-based reference selection for enhanced defect...

Pattern-to-design alignment for one-dimensional unique structures

Defect-location determination using correction loop for pixel align...

Optical-mode selection for multi-mode semiconductor inspection

Combining simulation and optical microscopy to determine inspection...

Defect classification by fitting optical signals to a point-spread...

File selection for test image to design alignment

Previous layer nuisance reduction through oblique illumination

Algorithm selector based on image frames

Training a learning based defect classifier

Performance monitoring of design-based alignment

Repeater defect detection

Identifying a source of nuisance defects on a wafer

Nuisance reduction using location-based attributes

Patents Applicationslast 30 patents

WAFER ALIGNMENT IMPROVEMENT THROUGH IMAGE PROJECTION-BASED PATCH-TO...

IMAGE CONTRAST METRICS FOR DERIVING AND IMPROVING IMAGING CONDITIONS

DEEP GENERATIVE MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS

SEMANTIC IMAGE SEGMENTATION FOR SEMICONDUCTOR-BASED APPLICATIONS

Setting Up Inspection of a Specimen

DEEP GENERATIVE MODELS FOR OPTICAL OR OTHER MODE SELECTION

CROSS LAYER COMMON-UNIQUE ANALYSIS FOR NUISANCE FILTERING

IMAGE ALIGNMENT SETUP FOR SPECIMENS WITH INTRA- AND INTER-SPECIMEN...

PRINT CHECK REPEATER DEFECT DETECTION

GENERATIVE ADVERSARIAL NETWORKS (GANs) FOR SIMULATING SPECIMEN IMAGES

Clustering Sub-Care Areas Based on Noise Characteristics

STATISTICAL LEARNING-BASED MODE SELECTION FOR MULTI-MODE INSPECTION

CONTROLLING A PROCESS FOR INSPECTION OF A SPECIMEN

MULTI-IMAGING MODE IMAGE ALIGNMENT

Unsupervised Learning-Based Reference Selection for Enhanced Defect...

PATTERN-TO-DESIGN ALIGNMENT FOR ONE-DIMENSIONAL UNIQUE STRUCTURES

SYSTEMS AND METHODS FOR SELECTING DEFECT DETECTION METHODS FOR INSP...

DESIGN FILE SELECTION FOR TEST IMAGE TO DESIGN ALIGNMENT

Repeater Defect Detection

System and Method for Inspection Using Tensor Decomposition and Sin...

Optical-Mode Selection for Multi-Mode Semiconductor Inspection

Defect Classification by Fitting Optical Signals to a Point-Spread...

ALGORITHM SELECTOR BASED ON IMAGE FRAMES

Defect-Location Determination Using Correction Loop for Pixel Align...

CROSS LAYER COMMON-UNIQUE ANALYSIS FOR NUISANCE FILTERING

PERFORMANCE MONITORING OF DESIGN-BASED ALIGNMENT

Capture of Repeater Defects on a Semiconductor Wafer

COMBINING SIMULATION AND OPTICAL MICROSCOPY TO DETERMINE INSPECTION...

PREVIOUS LAYER NUISANCE REDUCTION THROUGH OBLIQUE ILLUMINATION

Training a Learning Based Defect Classifier