Membership
Tour
Register
Log in
Blaine R. Spady
Follow
Person
Lincoln, NE, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Metrology/inspection positioning system
Patent number
7,295,314
Issue date
Nov 13, 2007
Nanometrics Incorporated
Blaine R. Spady
G01 - MEASURING TESTING
Information
Patent Grant
Image control in a metrology/inspection positioning system
Patent number
7,289,215
Issue date
Oct 30, 2007
Nanometrics Incorporated
Blaine R. Spady
G02 - OPTICS
Information
Patent Grant
Edge grip chuck
Patent number
7,032,287
Issue date
Apr 25, 2006
Nanometrics Incorporated
Blaine R. Spady
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Encoder measurement based on layer thickness
Patent number
6,970,255
Issue date
Nov 29, 2005
Nanometrics Incorporated
Blaine R. Spady
G01 - MEASURING TESTING
Information
Patent Grant
Precision polar coordinate stage
Patent number
6,910,847
Issue date
Jun 28, 2005
Nanometrics Incorporated
Christopher W. Blaufus
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stage with two substrate buffer station
Patent number
6,854,948
Issue date
Feb 15, 2005
Nanometrics Incorporated
Blaine R. Spady
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High precision substrate prealigner
Patent number
6,836,690
Issue date
Dec 28, 2004
Nanometrics Incorporated
Blaine R. Spady
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Compact rotating stage
Patent number
6,779,278
Issue date
Aug 24, 2004
Nanometrics Incorporated
Blaine R. Spady
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System using a polar coordinate stage and continuous image rotation...
Patent number
6,320,609
Issue date
Nov 20, 2001
Nanometrics Incorporated
Robert Buchanan
G02 - OPTICS
Information
Patent Grant
Compact optical reflectometer system
Patent number
6,181,427
Issue date
Jan 30, 2001
Nanometrics Incorporated
Richard A. Yarussi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGE CONTROL IN A METROLOGY/INSPECTION POSITIONING SYSTEM
Publication number
20070222991
Publication date
Sep 27, 2007
Nanometrics Incorporated
Blaine R. Spady
G02 - OPTICS