Blake A. Lindell

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Round Rock, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for simultaneously testing a component at mult...
- Patent number 10,838,000
- Issue date Nov 17, 2020
- National Instruments Corporation
- Blake A. Lindell
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital approach to the removal of AC parasitics for impedance meas...
- Patent number 9,910,074
- Issue date Mar 6, 2018
- National Instruments Corporation
- Blake A. Lindell
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Simultaneously Testing a Component at Mult...
- Publication number 20180267096
- Publication date Sep 20, 2018
- National Instruments Corporation
- Blake A. Lindell
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Digital Approach to the Removal of AC Parasitics for Impedance Meas...
- Publication number 20170139001
- Publication date May 18, 2017
- National Instruments Corporation
- Blake A. Lindell
- G01 - MEASURING TESTING