Blandine Lantz

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Saint Nizier 'du Moucherotte, FR

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Patents Grantslast 30 patents

Information Patent Grant
X-ray scattering apparatus
- Patent number 11,796,485
- Issue date Oct 24, 2023
- XENOCS SAS
- Peter Hoghoj
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for x-ray scattering material analysis
- Patent number 11,275,038
- Issue date Mar 15, 2022
- XENOCS SAS
- Peter Hoghoj
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam device
- Patent number 8,422,633
- Issue date Apr 16, 2013
- Xenocs S.A.
- Blandine Lantz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY SCATTERING APPARATUS
- Publication number 20220326166
- Publication date Oct 13, 2022
- XENOCS SAS
- Peter HOGHOJ
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR X-RAY SCATTERING MATERIAL ANALYSIS
- Publication number 20210364454
- Publication date Nov 25, 2021
- XENOCS SAS
- Peter HOGHOJ
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BEAM DEVICE
- Publication number 20100272239
- Publication date Oct 28, 2010
- Blandine Lantz
- G01 - MEASURING TESTING