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Blane Holden
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Boise, ID, US
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last 30 patents
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Patent Grant
System for evaluating and reporting semiconductor test processes
Patent number
6,256,593
Issue date
Jul 3, 2001
Micron Technology Inc.
Tim Damon
G11 - INFORMATION STORAGE
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Patent Grant
Method of selecting layout of integrated circuit probe card
Patent number
6,113,646
Issue date
Sep 5, 2000
Micron Technology, Inc.
Blane Holden
G01 - MEASURING TESTING
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Patent Grant
System for evaluating and reporting semiconductor test processes
Patent number
6,070,131
Issue date
May 30, 2000
Micron Technology, Inc.
Tim Damon
G11 - INFORMATION STORAGE