Bo Hyun KIM

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Cheonan-si, Chungcheongnam-do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Electroconductive particles and signal-transmitting connector havin...
- Patent number 11,763,959
- Issue date Sep 19, 2023
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,609,244
- Issue date Mar 21, 2023
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Electro-conductive part protecting member for signal transmission c...
- Patent number 11,233,352
- Issue date Jan 25, 2022
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket and test apparatus having the same, manufacturing metho...
- Patent number 11,199,577
- Issue date Dec 14, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROCONDUCTIVE PARTICLES AND SIGNAL-TRANSMITTING CONNECTOR HAVIN...
- Publication number 20220005626
- Publication date Jan 6, 2022
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTOR PART PROTECTION MEMBER FOR SIGNAL TRANSMISSION CONNECTOR...
- Publication number 20210313730
- Publication date Oct 7, 2021
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20210302468
- Publication date Sep 30, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...
- Publication number 20210293880
- Publication date Sep 23, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
HISTORY MANAGEMENT PAD OF SEMICONDUCTOR TEST SOCKET, MANUFACTURING...
- Publication number 20200233029
- Publication date Jul 23, 2020
- TSE CO.,LTD
- Bo Hyun KIM
- G01 - MEASURING TESTING