Bo Li

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Miniature high density opto-electronic package
- Patent number 9,974,163
- Issue date May 15, 2018
- FutureWei Technologies, Inc.
- Morgan Chen
- G02 - OPTICS
Information Patent Grant
Automatic inspection system for flat panel substrate
- Patent number 7,714,996
- Issue date May 11, 2010
- 3i Systems Corporation
- Zheng Yan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting surfaces with improved light effic...
- Patent number 7,564,544
- Issue date Jul 21, 2009
- 3i Systems Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Spatial filter for sample inspection system
- Patent number 7,184,138
- Issue date Feb 27, 2007
- KLA-Tencor Technologies Corporation
- Bo Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Miniature High Density Opto-Electronic Package
- Publication number 20140185253
- Publication date Jul 3, 2014
- FutureWei Technologies, Inc.
- Morgan Chen
- G02 - OPTICS
Information Patent Application
CRYSTALLINE PHOTOVOLTAIC CELLS AND METHODS OF MANUFACTURING
- Publication number 20140166099
- Publication date Jun 19, 2014
- Hongbin Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automatic inspection system for flat panel substrate
- Publication number 20080174771
- Publication date Jul 24, 2008
- Zheng Yan
- G01 - MEASURING TESTING
Information Patent Application
Method and system for inspecting surfaces with improved light effic...
- Publication number 20070222974
- Publication date Sep 27, 2007
- 3i Systems, Inc.
- Guoheng Zhao
- G01 - MEASURING TESTING