Bo-Yi Chang

Person

Hsin-Chu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Detection system sending calculated data and raw data
- Patent number 12,360,933
- Issue date Jul 15, 2025
- PixArt Imaging Inc.
- Yao-Hsuan Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring mask overlay using test patterns
- Patent number 12,271,116
- Issue date Apr 8, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tseng Chin Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image quality improving method, optical navigation device control m...
- Patent number 11,947,737
- Issue date Apr 2, 2024
- PixArt Imaging Inc.
- Bo-Yi Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit overlay test patterns and method thereof
- Patent number 11,762,302
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tseng Chin Lo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Image quality improving method, optical navigation device control m...
- Patent number 11,740,709
- Issue date Aug 29, 2023
- PixArt Imaging Inc.
- Bo-Yi Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit overlay test patterns and method thereof
- Patent number 11,016,398
- Issue date May 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tseng Chin Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image segmentation threshold value deciding method, gesture determi...
- Patent number 9,846,816
- Issue date Dec 19, 2017
- PixArt Imaging Inc.
- Bo-Yi Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical imaging system using structured illumination
- Patent number 9,599,805
- Issue date Mar 21, 2017
- National Synchrotron Radiation Research Center
- Su Yu Chiang
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Integrated Circuit Overlay Test Patterns And Method Thereof
- Publication number 20230359131
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tseng Chin Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE QUALITY IMPROVING METHOD, OPTICAL NAVIGATION DEVICE CONTROL M...
- Publication number 20230315218
- Publication date Oct 5, 2023
- PixArt Imaging Inc.
- Bo-Yi Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION SYSTEM SENDING CALCULATED DATA AND RAW DATA
- Publication number 20230176988
- Publication date Jun 8, 2023
- PIXART IMAGING INC.
- Yao-Hsuan LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE QUALITY IMPROVING METHOD, OPTICAL NAVIGATION DEVICE CONTROL M...
- Publication number 20220397966
- Publication date Dec 15, 2022
- PixArt Imaging Inc.
- Bo-Yi Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated Circuit Overlay Test Patterns and Method Thereof
- Publication number 20210278771
- Publication date Sep 9, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tseng Chin Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Overlay Test Patterns and Method Thereof
- Publication number 20190384185
- Publication date Dec 19, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Tseng Chin Lo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IMAGE SEGMENTATION THRESHOLD VALUE DECIDING METHOD, GESTURE DETERMI...
- Publication number 20170116742
- Publication date Apr 27, 2017
- PixArt Imaging Inc.
- Bo-Yi Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSFERRING ROLLER, TRANSMISSION ASSEMBLY, AND OFFICE MACHINE USIN...
- Publication number 20170097591
- Publication date Apr 6, 2017
- Avision Inc.
- Sheng-Yao SHIH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL IMAGING SYSTEM USING STRUCTURED ILLUMINATION
- Publication number 20130100525
- Publication date Apr 25, 2013
- Su Yu CHIANG
- G02 - OPTICS

Bo-Yi Chang

Person

Patents Grantslast 30 patents

Detection system sending calculated data and raw data

Method of measuring mask overlay using test patterns

Image quality improving method, optical navigation device control m...

Integrated circuit overlay test patterns and method thereof

Image quality improving method, optical navigation device control m...

Integrated circuit overlay test patterns and method thereof

Image segmentation threshold value deciding method, gesture determi...

Optical imaging system using structured illumination

Patents Applicationslast 30 patents

Integrated Circuit Overlay Test Patterns And Method Thereof

IMAGE QUALITY IMPROVING METHOD, OPTICAL NAVIGATION DEVICE CONTROL M...

DETECTION SYSTEM SENDING CALCULATED DATA AND RAW DATA

IMAGE QUALITY IMPROVING METHOD, OPTICAL NAVIGATION DEVICE CONTROL M...

Integrated Circuit Overlay Test Patterns and Method Thereof

Integrated Circuit Overlay Test Patterns and Method Thereof

IMAGE SEGMENTATION THRESHOLD VALUE DECIDING METHOD, GESTURE DETERMI...

TRANSFERRING ROLLER, TRANSMISSION ASSEMBLY, AND OFFICE MACHINE USIN...

OPTICAL IMAGING SYSTEM USING STRUCTURED ILLUMINATION