Boaz BRILL

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Analyte-sensing device
- Patent number 10,575,765
- Issue date Mar 3, 2020
- GLUSENSE LTD.
- Boaz Brill
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Monitoring system and method for verifying measurements in patterne...
- Patent number 10,295,329
- Issue date May 21, 2019
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process control using non-zero order diffraction
- Patent number 10,048,595
- Issue date Aug 14, 2018
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for optimizing optical inspection of patterned st...
- Patent number 9,904,993
- Issue date Feb 27, 2018
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 9,785,059
- Issue date Oct 10, 2017
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process control using non-zero order diffraction
- Patent number 9,568,872
- Issue date Feb 14, 2017
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 9,310,192
- Issue date Apr 12, 2016
- Nova Measuring Instruments, Ltd.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 9,184,102
- Issue date Nov 10, 2015
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and method for measuring in patterned structures
- Patent number 9,140,544
- Issue date Sep 22, 2015
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for use in monitoring properties of patterned str...
- Patent number 8,964,178
- Issue date Feb 24, 2015
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 8,941,832
- Issue date Jan 27, 2015
- Nova Measuring Instruments, Ltd.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and method for measuring in three-dimensional struct...
- Patent number 8,848,185
- Issue date Sep 30, 2014
- Nova Measuring Instruments Ltd.
- Gilad Barak
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical method and system utilizing operating with deep or vacuum U...
- Patent number 8,658,982
- Issue date Feb 25, 2014
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for use in monitoring properties of patterned str...
- Patent number 8,643,842
- Issue date Feb 4, 2014
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 8,531,678
- Issue date Sep 10, 2013
- Nova Measuring Instruments, Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Line edge roughness measuring technique and test structure
- Patent number 8,488,128
- Issue date Jul 16, 2013
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 8,363,219
- Issue date Jan 29, 2013
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for use in monitoring properties of patterned str...
- Patent number 8,289,515
- Issue date Oct 16, 2012
- Nova Measuring Instruments Ltd.
- Yoel Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 8,023,122
- Issue date Sep 20, 2011
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,864,343
- Issue date Jan 4, 2011
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,864,344
- Issue date Jan 4, 2011
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,791,740
- Issue date Sep 7, 2010
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,760,368
- Issue date Jul 20, 2010
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 7,715,007
- Issue date May 11, 2010
- Nova Measuring Instruments, Ltd.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,663,768
- Issue date Feb 16, 2010
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,626,710
- Issue date Dec 1, 2009
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,626,711
- Issue date Dec 1, 2009
- Nova Measuring Instruments
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,495,782
- Issue date Feb 24, 2009
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring patterned structures
- Patent number 7,477,405
- Issue date Jan 13, 2009
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Grant
Lateral shift measurement using an optical technique
- Patent number 7,301,163
- Issue date Nov 27, 2007
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...
- Publication number 20230401690
- Publication date Dec 14, 2023
- NOVA LTD
- Boaz BRILL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Monitoring system and method for verifying measurements in pattened...
- Publication number 20220163320
- Publication date May 26, 2022
- NOVA LTD
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...
- Publication number 20210090244
- Publication date Mar 25, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A METHOD AND SYSTEM FOR MONITORING ATTENTION OF A SUBJECT
- Publication number 20200121237
- Publication date Apr 23, 2020
- MINDSEYE DIAGNOSTICS LTD.
- Dov YELLIN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...
- Publication number 20200058118
- Publication date Feb 20, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING SYSTEM AND METHOD FOR VERIFYING MEASUREMENTS IN PATTENED...
- Publication number 20190339056
- Publication date Nov 7, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...
- Publication number 20180182089
- Publication date Jun 28, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
- Publication number 20180031983
- Publication date Feb 1, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz BRILL
- G01 - MEASURING TESTING
Information Patent Application
ANALYTE-SENSING DEVICE
- Publication number 20170303838
- Publication date Oct 26, 2017
- GluSense Ltd.
- Boaz BRILL
- G01 - MEASURING TESTING
Information Patent Application
PROCESS CONTROL USING NON-ZERO ORDER DIFFRACTION
- Publication number 20170205716
- Publication date Jul 20, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
IMPLANT ILLUMINATION
- Publication number 20170100598
- Publication date Apr 13, 2017
- GluSense Ltd.
- Yossi GROSS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IMPLANTABLE CELL ENCAPSULATION DEVICE
- Publication number 20170072074
- Publication date Mar 16, 2017
- GluSense Ltd.
- Micha GLADNIKOFF
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
- Publication number 20160327384
- Publication date Nov 10, 2016
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz BRILL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...
- Publication number 20160284077
- Publication date Sep 29, 2016
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20160109225
- Publication date Apr 21, 2016
- Nova Measuring Instruments Ltd.
- Moshe Finarov
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR FACILITATING CELL GROWTH IN AN IMPLANTABLE SENSOR
- Publication number 20150352229
- Publication date Dec 10, 2015
- GLUSENSE, LTD.
- Boaz BRILL
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
CONTROLLED DEATH OF IMPLANTED CELLS
- Publication number 20150343093
- Publication date Dec 3, 2015
- GluSense Ltd.
- Tehila HYMAN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND SYSTEM FOR USE IN OPTICAL MEASUREMENTS IN DEEP THREE-DIM...
- Publication number 20150168132
- Publication date Jun 18, 2015
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
- Publication number 20150124255
- Publication date May 7, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz BRILL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20150009504
- Publication date Jan 8, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Moshe FINAROV
- G01 - MEASURING TESTING
Information Patent Application
Monitoring system and method for verifying measurements in patterne...
- Publication number 20140195194
- Publication date Jul 10, 2014
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR MEASURING IN PATTERNED STRUCTURES
- Publication number 20140168646
- Publication date Jun 19, 2014
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STR...
- Publication number 20140142869
- Publication date May 22, 2014
- NOVA MEASURING INSTRUMENTS LTD.
- YOEL COHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...
- Publication number 20140079312
- Publication date Mar 20, 2014
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
PROCESS CONTROL USING NON-ZERO ORDER DIFFRACTION
- Publication number 20140028993
- Publication date Jan 30, 2014
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES
- Publication number 20140009760
- Publication date Jan 9, 2014
- NOVA MEASURING INSTRUMENTS LTD.
- Moshe FINAROV
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR MEASURING IN THREE-DIMENSIONAL STRUCT...
- Publication number 20130308131
- Publication date Nov 21, 2013
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR USE IN MEASURING IN COMPLEX PATTERNED STRUCTURES
- Publication number 20130282343
- Publication date Oct 24, 2013
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...
- Publication number 20130208973
- Publication date Aug 15, 2013
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
- Publication number 20130128270
- Publication date May 23, 2013
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz BRILL
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Analyte-sensing device

Monitoring system and method for verifying measurements in patterne...

Process control using non-zero order diffraction

Method and system for optimizing optical inspection of patterned st...

Lateral shift measurement using an optical technique

Process control using non-zero order diffraction

Lateral shift measurement using an optical technique

Method and system for measuring patterned structures

Optical system and method for measuring in patterned structures

Method and system for use in monitoring properties of patterned str...

Lateral shift measurement using an optical technique

Optical system and method for measuring in three-dimensional struct...

Optical method and system utilizing operating with deep or vacuum U...

Method and system for use in monitoring properties of patterned str...

Method and system for measuring patterned structures

Line edge roughness measuring technique and test structure

Lateral shift measurement using an optical technique

Method and system for use in monitoring properties of patterned str...

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Lateral shift measurement using an optical technique

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Method and system for measuring patterned structures

Lateral shift measurement using an optical technique

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...

Monitoring system and method for verifying measurements in pattened...

METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...

A METHOD AND SYSTEM FOR MONITORING ATTENTION OF A SUBJECT

METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...

MONITORING SYSTEM AND METHOD FOR VERIFYING MEASUREMENTS IN PATTENED...

METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...

LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE

ANALYTE-SENSING DEVICE

PROCESS CONTROL USING NON-ZERO ORDER DIFFRACTION

IMPLANT ILLUMINATION

IMPLANTABLE CELL ENCAPSULATION DEVICE

LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE

METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES

APPARATUS FOR FACILITATING CELL GROWTH IN AN IMPLANTABLE SENSOR

CONTROLLED DEATH OF IMPLANTED CELLS

METHOD AND SYSTEM FOR USE IN OPTICAL MEASUREMENTS IN DEEP THREE-DIM...

LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES

Monitoring system and method for verifying measurements in patterne...

OPTICAL SYSTEM AND METHOD FOR MEASURING IN PATTERNED STRUCTURES

METHOD AND SYSTEM FOR USE IN MONITORING PROPERTIES OF PATTERNED STR...

METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...

PROCESS CONTROL USING NON-ZERO ORDER DIFFRACTION

METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES

OPTICAL SYSTEM AND METHOD FOR MEASURING IN THREE-DIMENSIONAL STRUCT...

METHOD AND SYSTEM FOR USE IN MEASURING IN COMPLEX PATTERNED STRUCTURES

METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...

LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE