Boaz Cohen

Person

Lehavim, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Machine learning-based classification of defects in a semiconductor...
- Patent number 12,361,531
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 12,183,066
- Issue date Dec 31, 2024
- Applied Materials Israel Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection of a semiconductor specimen
- Patent number 11,983,867
- Issue date May 14, 2024
- Applied Materials Israel Ltd.
- Ariel Shkalim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selecting a representative subset of potential defects to improve d...
- Patent number 11,940,390
- Issue date Mar 26, 2024
- Applied Materials Israel Ltd.
- Yotam Sofer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects in semiconductor specimens using weak labeling
- Patent number 11,790,515
- Issue date Oct 17, 2023
- Applied Materials Israel Ltd.
- Irad Peleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining a critical dimension variation of a pattern
- Patent number 11,756,188
- Issue date Sep 12, 2023
- Applied Materials Israel Ltd.
- Vadim Vereschagin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,568,531
- Issue date Jan 31, 2023
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning-based defect detection of a specimen
- Patent number 11,449,711
- Issue date Sep 20, 2022
- Applied Materials Isreal Ltd
- Ran Badanes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination of defect location for examination of a specimen
- Patent number 11,423,529
- Issue date Aug 23, 2022
- Applied Materials Isreal Ltd
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects in semiconductor specimens using weak labeling
- Patent number 11,379,972
- Issue date Jul 5, 2022
- Applied Materials Israel Ltd.
- Irad Peleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selecting a coreset of potential defects for estimating expected de...
- Patent number 11,360,030
- Issue date Jun 14, 2022
- Applied Materials Isreal Ltd
- Yotam Sofer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,348,001
- Issue date May 31, 2022
- APPLIED MATERIAL ISRAEL, LTD.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection of a semiconductor specimen
- Patent number 11,348,224
- Issue date May 31, 2022
- Applied Materials Israel Ltd.
- Ariel Shkalim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of classifying defects in a specimen semiconductor examinati...
- Patent number 11,321,633
- Issue date May 3, 2022
- Applied Materials Israel Ltd.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining a critical dimension variation of a pattern
- Patent number 11,276,160
- Issue date Mar 15, 2022
- Applied Materials Israel Ltd.
- Vadim Vereschagin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and methods of generating comparable regions of a lithograph...
- Patent number 11,263,741
- Issue date Mar 1, 2022
- Applied Materials Israel Ltd.
- Boaz Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,205,119
- Issue date Dec 21, 2021
- Applied Materials Israel Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating a training set usable for examination of a semiconductor...
- Patent number 11,199,506
- Issue date Dec 14, 2021
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic selection of algorithmic modules for examination of a spe...
- Patent number 11,151,710
- Issue date Oct 19, 2021
- Applied Materials Israel Ltd.
- Ran Schleyen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of classifying defects in a semiconductor specimen and syste...
- Patent number 11,151,706
- Issue date Oct 19, 2021
- APPLIED MATERIAL ISRAEL, LTD.
- Kirill Savchenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for classifying a multi...
- Patent number 11,138,507
- Issue date Oct 5, 2021
- Applied Materials Israel Ltd.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of classifying defects in a semiconductor specimen and syste...
- Patent number 11,037,286
- Issue date Jun 15, 2021
- Applied Materials Israel Ltd.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,010,665
- Issue date May 18, 2021
- APPLIED MATERIAL ISRAEL, LTD.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for classifying defects
- Patent number 10,921,334
- Issue date Feb 16, 2021
- Applied Materials Israel Ltd.
- Kirill Savchenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of generating a training set usable for examination of a sem...
- Patent number 10,832,092
- Issue date Nov 10, 2020
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Guided inspection of a semiconductor wafer based on systematic defects
- Patent number 10,605,745
- Issue date Mar 31, 2020
- Applied Materials Israel Ltd.
- Yotam Sofer
- G01 - MEASURING TESTING
Information Patent Grant
System and method for printability based inspection
- Patent number 9,927,375
- Issue date Mar 27, 2018
- Applied Materials Israel Ltd.
- Shay Attal
- G01 - MEASURING TESTING
Information Patent Grant
System and method for patch based inspection
- Patent number 9,904,995
- Issue date Feb 27, 2018
- Applied Materials Israel, Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT OFFSET CORRECTION FOR EXAMINATION OF SEMICONDUCTOR SPECIMENS
- Publication number 20250224343
- Publication date Jul 10, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Albert KAO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN
- Publication number 20240078659
- Publication date Mar 7, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehonatan Hai OFIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING DEFECTS IN SEMICONDUCTOR SPECIMENS USING WEAK LABELING
- Publication number 20220301151
- Publication date Sep 22, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Irad PELEG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF
- Publication number 20220291138
- Publication date Sep 15, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220254000
- Publication date Aug 11, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING-BASED CLASSIFICATION OF DEFECTS IN A SEMICONDUCTOR...
- Publication number 20220222806
- Publication date Jul 14, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN
- Publication number 20220198639
- Publication date Jun 23, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Vadim VERESCHAGIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20220067523
- Publication date Mar 3, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING DEFECTS IN SEMICONDUCTOR SPECIMENS USING WEAK LABELING
- Publication number 20210383530
- Publication date Dec 9, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Irad PELEG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC SELECTION OF ALGORITHMIC MODULES FOR EXAMINATION OF A SPE...
- Publication number 20210343000
- Publication date Nov 4, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ran SCHLEYEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF DEFECT LOCATION FOR EXAMINATION OF A SPECIMEN
- Publication number 20210256687
- Publication date Aug 19, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Doron GIRMONSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF
- Publication number 20210239623
- Publication date Aug 5, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS OF GENERATING COMPARABLE REGIONS OF A LITHOGRAPH...
- Publication number 20210233220
- Publication date Jul 29, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Boaz Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING-BASED DEFECT DETECTION OF A SPECIMEN
- Publication number 20210209418
- Publication date Jul 8, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ran BADANES
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20210073963
- Publication date Mar 11, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN
- Publication number 20200327652
- Publication date Oct 15, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Vadim VERESCHAGIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...
- Publication number 20200294224
- Publication date Sep 17, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...
- Publication number 20200226743
- Publication date Jul 16, 2020
- Kirill SAVCHENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method Of Generating A Training Set Usable For Examination Of A Sem...
- Publication number 20200226420
- Publication date Jul 16, 2020
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CLASSIFYING DEFECTS IN A SPECIMEN SEMICONDUCTOR EXAMINATI...
- Publication number 20200202252
- Publication date Jun 25, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SYSTEMATIC DEFECTS
- Publication number 20200003700
- Publication date Jan 2, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Yotam Sofer
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFYING DEFECTS
- Publication number 20190293669
- Publication date Sep 26, 2019
- Applied Materials Israel Ltd.
- Kirill SAVCHENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING A TRAINING SET USABLE FOR EXAMINATION OF A SEMICONDUCTOR...
- Publication number 20190257767
- Publication date Aug 22, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...
- Publication number 20190096053
- Publication date Mar 28, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFYING A MULTI...
- Publication number 20190095800
- Publication date Mar 28, 2019
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...
- Publication number 20170364798
- Publication date Dec 21, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20170357895
- Publication date Dec 14, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PRINTABILITY BASED INSPECTION
- Publication number 20170176347
- Publication date Jun 22, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Shay Attal
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20170177997
- Publication date Jun 22, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PATCH BASED INSPECTION
- Publication number 20170169554
- Publication date Jun 15, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Machine learning-based classification of defects in a semiconductor...

Method of deep learning-based examination of a semiconductor specim...

Mask inspection of a semiconductor specimen

Selecting a representative subset of potential defects to improve d...

Detecting defects in semiconductor specimens using weak labeling

Determining a critical dimension variation of a pattern

Method of deep learning-based examination of a semiconductor specim...

Machine learning-based defect detection of a specimen

Determination of defect location for examination of a specimen

Detecting defects in semiconductor specimens using weak labeling

Selecting a coreset of potential defects for estimating expected de...

Method of deep learning-based examination of a semiconductor specim...

Mask inspection of a semiconductor specimen

Method of classifying defects in a specimen semiconductor examinati...

Determining a critical dimension variation of a pattern

System and methods of generating comparable regions of a lithograph...

Method of deep learning-based examination of a semiconductor specim...

Generating a training set usable for examination of a semiconductor...

Automatic selection of algorithmic modules for examination of a spe...

Method of classifying defects in a semiconductor specimen and syste...

System, method and computer program product for classifying a multi...

Method of classifying defects in a semiconductor specimen and syste...

Method of deep learning-based examination of a semiconductor specim...

System, method and computer program product for classifying defects

Method of generating a training set usable for examination of a sem...

Guided inspection of a semiconductor wafer based on systematic defects

System and method for printability based inspection

System and method for patch based inspection

Patents Applicationslast 30 patents

DEFECT OFFSET CORRECTION FOR EXAMINATION OF SEMICONDUCTOR SPECIMENS

DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN

DETECTING DEFECTS IN SEMICONDUCTOR SPECIMENS USING WEAK LABELING

METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF

MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN

MACHINE LEARNING-BASED CLASSIFICATION OF DEFECTS IN A SEMICONDUCTOR...

DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

DETECTING DEFECTS IN SEMICONDUCTOR SPECIMENS USING WEAK LABELING

AUTOMATIC SELECTION OF ALGORITHMIC MODULES FOR EXAMINATION OF A SPE...

DETERMINATION OF DEFECT LOCATION FOR EXAMINATION OF A SPECIMEN

METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF

SYSTEM AND METHODS OF GENERATING COMPARABLE REGIONS OF A LITHOGRAPH...

MACHINE LEARNING-BASED DEFECT DETECTION OF A SPECIMEN

MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN

DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN

METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...

METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...

Method Of Generating A Training Set Usable For Examination Of A Sem...

METHOD OF CLASSIFYING DEFECTS IN A SPECIMEN SEMICONDUCTOR EXAMINATI...

GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SYSTEMATIC DEFECTS

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFYING DEFECTS

GENERATING A TRAINING SET USABLE FOR EXAMINATION OF A SEMICONDUCTOR...

METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFYING A MULTI...

METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

SYSTEM AND METHOD FOR PRINTABILITY BASED INSPECTION

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

SYSTEM AND METHOD FOR PATCH BASED INSPECTION