Bob Baoping He

Person

Hercules, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement of crystallite size distribution in polycrystalline mat...
- Patent number 11,397,154
- Issue date Jul 26, 2022
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional X-ray detector position calibration and correction...
- Patent number 10,444,169
- Issue date Oct 15, 2019
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction device and method to measure stress with 2D detec...
- Patent number 10,416,102
- Issue date Sep 17, 2019
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for extending angular coverage for a scanning...
- Patent number 10,295,484
- Issue date May 21, 2019
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Method for collecting accurate X-ray diffraction data with a scanni...
- Patent number 9,897,559
- Issue date Feb 20, 2018
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for using an area X-ray detector as a point de...
- Patent number 8,548,123
- Issue date Oct 1, 2013
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring crystallite size with a two-dimensional X-ray...
- Patent number 7,885,383
- Issue date Feb 8, 2011
- Bruker AXS, Inc.
- Bob B. He
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer having co-exiting stages optimized for single...
- Patent number 7,848,489
- Issue date Dec 7, 2010
- Broker AXS, Inc
- Bob B. He
- G01 - MEASURING TESTING
Information Patent Grant
Handheld two-dimensional X-ray diffractometer
- Patent number 7,646,847
- Issue date Jan 12, 2010
- Bruker AXS Inc.
- Bob B. He
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid x-ray mirrors
- Patent number 7,403,593
- Issue date Jul 22, 2008
- Bruker AXS, Inc.
- Bob Baoping He
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multiple wavelength X-ray source
- Patent number 7,317,784
- Issue date Jan 8, 2008
- Broker AXS, Inc
- Roger D. Durst
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Combinatorial screening system and X-ray diffraction and Raman spec...
- Patent number 7,269,245
- Issue date Sep 11, 2007
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-position x-ray tube for diffractometer
- Patent number 7,248,672
- Issue date Jul 24, 2007
- Bruker AXS, Inc.
- Roger D. Durst
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction screening system convertible between reflection a...
- Patent number 7,242,745
- Issue date Jul 10, 2007
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Scanning line detector for two-dimensional x-ray diffractometer
- Patent number 7,190,762
- Issue date Mar 13, 2007
- Broker AXS, Inc
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Vertical small angle x-ray scattering system
- Patent number 6,956,928
- Issue date Oct 18, 2005
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Transmission mode X-ray diffraction screening system
- Patent number 6,859,520
- Issue date Feb 22, 2005
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction system for biological crystal screening
- Patent number 6,836,532
- Issue date Dec 28, 2004
- Bruker AXS, Inc.
- Roger D. Durst
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction screening system with retractable x-ray shield
- Patent number 6,718,008
- Issue date Apr 6, 2004
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Non-spilling cryogenic transfer vial for crystal sample mounting
- Patent number 6,701,743
- Issue date Mar 9, 2004
- Bruker AXS, Inc.
- Roger D. Durst
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Beam scattering measurement system with transmitted beam energy det...
- Patent number 6,163,592
- Issue date Dec 19, 2000
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT OF CRYSTALLITE SIZE DISTRIBUTION IN POLYCRYSTALLINE MAT...
- Publication number 20210033546
- Publication date Feb 4, 2021
- Bruker AXS, LLC
- Bob Baoping HE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION DEVICE AND METHOD TO MEASURE STRESS WITH 2D DETEC...
- Publication number 20180372658
- Publication date Dec 27, 2018
- Bruker AXS, Inc.
- Bob Baoping HE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EXTENDING ANGULAR COVERAGE FOR A SCANNING...
- Publication number 20180292334
- Publication date Oct 11, 2018
- Bruker AXS, Inc.
- Bob Baoping HE
- G01 - MEASURING TESTING
Information Patent Application
TWO-DIMENSIONAL X-RAY DETECTOR POSITION CALIBRATION AND CORRECTION...
- Publication number 20170343490
- Publication date Nov 30, 2017
- Bruker AXS, Inc.
- Bob Baoping HE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNI...
- Publication number 20170176355
- Publication date Jun 22, 2017
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR USING AN AREA X-RAY DETECTOR AS A POINT DE...
- Publication number 20110268251
- Publication date Nov 3, 2011
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD TWO-DIMENSIONAL X-RAY DIFFRACTOMETER
- Publication number 20090274274
- Publication date Nov 5, 2009
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Application
Multiple wavelength X-ray source
- Publication number 20070165780
- Publication date Jul 19, 2007
- Bruker AXS, Inc.
- Roger D. Durst
- G01 - MEASURING TESTING
Information Patent Application
Multiple-position x-ray tube for diffractometer
- Publication number 20060239408
- Publication date Oct 26, 2006
- Bruker AXS Inc.
- Roger D. Durst
- G01 - MEASURING TESTING
Information Patent Application
Scanning line detector for two-dimensional x-ray diffractometer
- Publication number 20060093090
- Publication date May 4, 2006
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Application
Combinatorial screening system with X-ray diffraction and Raman spe...
- Publication number 20060023837
- Publication date Feb 2, 2006
- Bruker AXS, Inc.
- Bob Baoping He
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
X-ray diffraction screening system convertible between reflection a...
- Publication number 20060023838
- Publication date Feb 2, 2006
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Application
Vertical small angle x-ray scattering system
- Publication number 20040223586
- Publication date Nov 11, 2004
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Application
Diffraction system for biological crystal screening
- Publication number 20040013231
- Publication date Jan 22, 2004
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Application
Transmission mode X-ray diffraction screening system
- Publication number 20030219099
- Publication date Nov 27, 2003
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Application
Diffraction system for biological crystal screening
- Publication number 20030147496
- Publication date Aug 7, 2003
- Bruker AXS, Inc.
- Roger D. Durst
- C30 - CRYSTAL GROWTH

Bob Baoping He

Person

Patents Grantslast 30 patents

Measurement of crystallite size distribution in polycrystalline mat...

Two-dimensional X-ray detector position calibration and correction...

X-ray diffraction device and method to measure stress with 2D detec...

Method and apparatus for extending angular coverage for a scanning...

Method for collecting accurate X-ray diffraction data with a scanni...

Method and apparatus for using an area X-ray detector as a point de...

Method for measuring crystallite size with a two-dimensional X-ray...

X-ray diffractometer having co-exiting stages optimized for single...

Handheld two-dimensional X-ray diffractometer

Hybrid x-ray mirrors

Multiple wavelength X-ray source

Combinatorial screening system and X-ray diffraction and Raman spec...

Multiple-position x-ray tube for diffractometer

X-ray diffraction screening system convertible between reflection a...

Scanning line detector for two-dimensional x-ray diffractometer

Vertical small angle x-ray scattering system

Transmission mode X-ray diffraction screening system

Diffraction system for biological crystal screening

X-ray diffraction screening system with retractable x-ray shield

Non-spilling cryogenic transfer vial for crystal sample mounting

Beam scattering measurement system with transmitted beam energy det...

Patents Applicationslast 30 patents

MEASUREMENT OF CRYSTALLITE SIZE DISTRIBUTION IN POLYCRYSTALLINE MAT...

X-RAY DIFFRACTION DEVICE AND METHOD TO MEASURE STRESS WITH 2D DETEC...

METHOD AND APPARATUS FOR EXTENDING ANGULAR COVERAGE FOR A SCANNING...

TWO-DIMENSIONAL X-RAY DETECTOR POSITION CALIBRATION AND CORRECTION...

METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNI...

METHOD AND APPARATUS FOR USING AN AREA X-RAY DETECTOR AS A POINT DE...

HANDHELD TWO-DIMENSIONAL X-RAY DIFFRACTOMETER

Multiple wavelength X-ray source

Multiple-position x-ray tube for diffractometer

Scanning line detector for two-dimensional x-ray diffractometer

Combinatorial screening system with X-ray diffraction and Raman spe...

X-ray diffraction screening system convertible between reflection a...

Vertical small angle x-ray scattering system

Diffraction system for biological crystal screening

Transmission mode X-ray diffraction screening system

Diffraction system for biological crystal screening