Bobin Mathew SKARIA

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Image generation for examination of a semiconductor specimen
- Patent number 11,995,848
- Issue date May 28, 2024
- Applied Materials Israel Ltd.
- David Uliel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image acquisition by an electron beam examination tool for metrolog...
- Patent number 11,828,714
- Issue date Nov 28, 2023
- Applied Materials Israel Ltd.
- Bobin Mathew Skaria
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
END-TO-END MEASUREMENT FOR SEMICONDUCTOR SPECIMENS
- Publication number 20240105522
- Publication date Mar 28, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Tomer Haim PELED
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE GENERATION FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220301196
- Publication date Sep 22, 2022
- APPLIED MATERIALS ISRAEL LTD.
- David ULIEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ACQUISITION BY AN ELECTRON BEAM EXAMINATION TOOL FOR METROLOG...
- Publication number 20220099592
- Publication date Mar 31, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Bobin Mathew SKARIA
- H01 - BASIC ELECTRIC ELEMENTS