Bohuslav Sed'a

Person

Blansko, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Method to correct first order astigmatism and first order distortio...
- Patent number 12,106,933
- Issue date Oct 1, 2024
- FEI Company
- Jan Stopka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for inspection of a specimen with a pl...
- Patent number 11,676,795
- Issue date Jun 13, 2023
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam electron microscope
- Patent number 10,937,627
- Issue date Mar 2, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D defect characterization of crystalline samples in a scanning typ...
- Patent number 10,784,076
- Issue date Sep 22, 2020
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle microscope with astigmatism compensation and energ...
- Patent number 9,741,525
- Issue date Aug 22, 2017
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-column detector for particle-optical column
- Patent number 9,362,086
- Issue date Jun 7, 2016
- FEI Company
- Lubomír Tůma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for imaging a sample in a charged particle apparatus
- Patent number 9,053,899
- Issue date Jun 9, 2015
- FEI COMPANY
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR ALIGNING A MULTI-BEAM SYSTEM
- Publication number 20230317405
- Publication date Oct 5, 2023
- FEI Company
- Jan STOPKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING BEAM POSITION
- Publication number 20230206489
- Publication date Jun 29, 2023
- FEI Company
- Jan STOPKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO CORRECT FIRST ORDER ASTIGMATISM AND FIRST ORDER DISTORTIO...
- Publication number 20220328284
- Publication date Oct 13, 2022
- FEI Company
- Jan Stopka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20210296088
- Publication date Sep 23, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20200312610
- Publication date Oct 1, 2020
- FEI Company
- Petr Hlavenka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D DEFECT CHARACTERIZATION OF CRYSTALLINE SAMPLES IN A SCANNING TYP...
- Publication number 20200013581
- Publication date Jan 9, 2020
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM ELECTRON MICROSCOPE
- Publication number 20190378681
- Publication date Dec 12, 2019
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...
- Publication number 20180061613
- Publication date Mar 1, 2018
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH ASTIGMATISM COMPENSATION AND ENERG...
- Publication number 20170221673
- Publication date Aug 3, 2017
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMAGING A SAMPLE IN A CHARGED PARTICLE APPARATUS
- Publication number 20140361165
- Publication date Dec 11, 2014
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN
- Publication number 20140097341
- Publication date Apr 10, 2014
- FEI Company
- Lubomir Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN
- Publication number 20120273677
- Publication date Nov 1, 2012
- FEI Company
- Lubomir Tuma
- H01 - BASIC ELECTRIC ELEMENTS

Bohuslav Sed'a

Person

Patents Grantslast 30 patents

Method to correct first order astigmatism and first order distortio...

Charged particle beam device for inspection of a specimen with a pl...

Multi-beam electron microscope

3D defect characterization of crystalline samples in a scanning typ...

Charged-particle microscope with astigmatism compensation and energ...

In-column detector for particle-optical column

Method for imaging a sample in a charged particle apparatus

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR ALIGNING A MULTI-BEAM SYSTEM

METHOD AND SYSTEM FOR DETERMINING BEAM POSITION

METHOD TO CORRECT FIRST ORDER ASTIGMATISM AND FIRST ORDER DISTORTIO...

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

3D DEFECT CHARACTERIZATION OF CRYSTALLINE SAMPLES IN A SCANNING TYP...

MULTI-BEAM ELECTRON MICROSCOPE

CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...

CHARGED-PARTICLE MICROSCOPE WITH ASTIGMATISM COMPENSATION AND ENERG...

METHOD FOR IMAGING A SAMPLE IN A CHARGED PARTICLE APPARATUS

IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN

IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN