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Bok Lae CHO
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Daejeon, KR
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Patents Grants
last 30 patents
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Patent Grant
Sample chamber device for electron microscope, and electron microsc...
Patent number
10,312,049
Issue date
Jun 4, 2019
Korea Research Institute of Standards and Science
Bok Lae Cho
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope electron gun for facilitating position adjustme...
Patent number
10,128,077
Issue date
Nov 13, 2018
Korea Research Institute of Standards and Science
Bok Lae Cho
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Monochromator and charged particle apparatus including the same
Patent number
9,425,022
Issue date
Aug 23, 2016
Korea Research Institute of Standards and Science
Takashi Ogawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
ELECTRON MICROSCOPE ELECTRON GUN FOR FACILITATING POSITION ADJUSTME...
Publication number
20180218874
Publication date
Aug 2, 2018
Korea Research Institute of Standards and Science
Bok Lae CHO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE CHAMBER DEVICE FOR ELECTRON MICROSCOPE, AND ELECTRON MICROSC...
Publication number
20180158645
Publication date
Jun 7, 2018
Korea Research Institute of Standards and Science
Bok Lae CHO
G02 - OPTICS
Information
Patent Application
MONOCHROMATOR AND CHARGED PARTICLE APPARATUS INCLUDING THE SAME
Publication number
20150371811
Publication date
Dec 24, 2015
Korea Research Institute of Standards and Science
Takashi OGAWA
G01 - MEASURING TESTING