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Boleslaw Czabai
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Avenel, NJ, US
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last 30 patents
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Patent Grant
Device for internal flaw magnification during wire drawing
Patent number
8,943,681
Issue date
Feb 3, 2015
Oxford Superconducting Technology
Jeff Parrell
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
DEVICE AND METHOD FOR INTERNAL FLAW MAGNIFICATION OR REMOVAL
Publication number
20100101076
Publication date
Apr 29, 2010
Jeff Parrell
G01 - MEASURING TESTING