Bonggyu Kang

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Yongin-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 11,982,707
- Issue date May 14, 2024
- Samsung Electronics Co., Ltd.
- Junsik Park
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing an integrated circuit involving performing...
- Patent number 11,650,237
- Issue date May 16, 2023
- Samsung Electronics Co., Ltd.
- Bonggyu Kang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230133288
- Publication date May 4, 2023
- Samsung Electronics Co.,Ltd.
- Junsik PARK
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE AND ELECTRONIC DEVICE INCLUDING THE SAME
- Publication number 20230048277
- Publication date Feb 16, 2023
- Samsung Electronics Co., Ltd.
- Bonggyu KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE INCLUDING THERMAL INTERFACE MATERIAL LAYER AND SE...
- Publication number 20220367428
- Publication date Nov 17, 2022
- Samsung Electronics Co., Ltd.
- Yongha KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT INVOLVING PERFORMING...
- Publication number 20220091171
- Publication date Mar 24, 2022
- Samsung Electronics Co., Ltd.
- Bonggyu Kang
- G01 - MEASURING TESTING