Bonnie E. Weir

Person

City of Bronxville, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Breaking up long-channel field effect transistor into smaller segme...
- Patent number 8,875,070
- Issue date Oct 28, 2014
- LSI Corporation
- David Averill Bell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using entire area of chip in TDDB checking
- Patent number 8,775,994
- Issue date Jul 8, 2014
- LSI Corporation
- Bonnie E. Weir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mitigation of detrimental breakdown of a high dielectric constant m...
- Patent number 8,624,352
- Issue date Jan 7, 2014
- LSI Corporation
- Bonnie E. Weir
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and process for reducing damaging breakdown in...
- Patent number 8,241,986
- Issue date Aug 14, 2012
- Agere Systems Inc.
- Taeho Kook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and process for reducing damaging breakdown in...
- Patent number 8,089,130
- Issue date Jan 3, 2012
- Agere Systems Inc.
- Taeho Kook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hot-electronic injection testing of transistors on a wafer
- Patent number 7,898,277
- Issue date Mar 1, 2011
- Agere Systems Inc.
- Bonnie Weir
- G01 - MEASURING TESTING
Information Patent Grant
Embedded test circuitry and a method for testing a semiconductor de...
- Patent number 7,332,924
- Issue date Feb 19, 2008
- Agere Systems, INC
- Edward B. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Detecting defects in integrated circuits
- Patent number 6,043,662
- Issue date Mar 28, 2000
- Glenn Baldwin Alers
- G01 - MEASURING TESTING
Information Patent Grant
Detecting breakdown in dielectric layers
- Patent number 5,804,975
- Issue date Sep 8, 1998
- Lucent Technologies Inc.
- Glenn Baldwin Alers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HOT-CARRIER INJECTION RELIABILITY CHECKS BASED ON GATE VOLTAGE DEPE...
- Publication number 20140095126
- Publication date Apr 3, 2014
- LSI Corporation
- Bonnie E. Weir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HOT-CARRIER INJECTION RELIABILITY CHECKS BASED ON BIAS TEMPERATURE...
- Publication number 20140095127
- Publication date Apr 3, 2014
- LSI Corporation
- Bonnie E. Weir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HOT-CARRIER INJECTION RELIABILITY CHECKS BASED ON BACK BIAS EFFECT...
- Publication number 20140095139
- Publication date Apr 3, 2014
- LSI Corporation
- Bonnie E. Weir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHECKING FOR HIGH BACK-BIAS IN LONG GATE-LENGTH, HIGH TEMPERATURE C...
- Publication number 20140095138
- Publication date Apr 3, 2014
- LSI Corporation
- Bonnie E. Weir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BREAKING UP LONG-CHANNEL FIELD EFFECT TRANSISTOR INTO SMALLER SEGME...
- Publication number 20140096094
- Publication date Apr 3, 2014
- LSI Corporation
- David Averill Bell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING ENTIRE AREA OF CHIP IN TDDB CHECKING
- Publication number 20140096098
- Publication date Apr 3, 2014
- LSI Corporation
- Bonnie E. Weir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BIAS-TEMPERATURE INSTABILITY RELIABILITY CHECKS BASED ON GATE VOLTA...
- Publication number 20140095140
- Publication date Apr 3, 2014
- LSI Corporation
- Bonnie E. Weir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MITIGATION OF DETRIMENTAL BREAKDOWN OF A HIGH DIELECTRIC CONSTANT M...
- Publication number 20120126364
- Publication date May 24, 2012
- LSI Corporation
- Bonnie E. Weir
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND PROCESS FOR REDUCING DAMAGING BREAKDOWN IN...
- Publication number 20120077323
- Publication date Mar 29, 2012
- Agere Systems Incorporated
- Taeho Kook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hot-Electron Injection Testing of Transistors on a Wafer
- Publication number 20100156454
- Publication date Jun 24, 2010
- Agere Systems, Inc.
- Bonnie Elaine Weir
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND PROCESS FOR REDUCING DAMAGING BREAKDOWN IN...
- Publication number 20070290278
- Publication date Dec 20, 2007
- Agere Systems Incorporated
- Taeho Kook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Embedded test circuitry and a method for testing a semiconductor de...
- Publication number 20070109005
- Publication date May 17, 2007
- Agere Systems Inc.
- Edward B. Harris
- G01 - MEASURING TESTING

Bonnie E. Weir

Person

Patents Grantslast 30 patents

Breaking up long-channel field effect transistor into smaller segme...

Using entire area of chip in TDDB checking

Mitigation of detrimental breakdown of a high dielectric constant m...

Semiconductor device and process for reducing damaging breakdown in...

Semiconductor device and process for reducing damaging breakdown in...

Hot-electronic injection testing of transistors on a wafer

Embedded test circuitry and a method for testing a semiconductor de...

Detecting defects in integrated circuits

Detecting breakdown in dielectric layers

Patents Applicationslast 30 patents

HOT-CARRIER INJECTION RELIABILITY CHECKS BASED ON GATE VOLTAGE DEPE...

HOT-CARRIER INJECTION RELIABILITY CHECKS BASED ON BIAS TEMPERATURE...

HOT-CARRIER INJECTION RELIABILITY CHECKS BASED ON BACK BIAS EFFECT...

CHECKING FOR HIGH BACK-BIAS IN LONG GATE-LENGTH, HIGH TEMPERATURE C...

BREAKING UP LONG-CHANNEL FIELD EFFECT TRANSISTOR INTO SMALLER SEGME...

USING ENTIRE AREA OF CHIP IN TDDB CHECKING

BIAS-TEMPERATURE INSTABILITY RELIABILITY CHECKS BASED ON GATE VOLTA...

MITIGATION OF DETRIMENTAL BREAKDOWN OF A HIGH DIELECTRIC CONSTANT M...

SEMICONDUCTOR DEVICE AND PROCESS FOR REDUCING DAMAGING BREAKDOWN IN...

Hot-Electron Injection Testing of Transistors on a Wafer

SEMICONDUCTOR DEVICE AND PROCESS FOR REDUCING DAMAGING BREAKDOWN IN...

Embedded test circuitry and a method for testing a semiconductor de...