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last 30 patents
Information
Patent Grant
Test contact mechanism
Patent number
6,703,853
Issue date
Mar 9, 2004
Advanced Micro Devices, Inc.
Boon Hee Wee
G01 - MEASURING TESTING
Information
Patent Grant
Design of IC package test handler with temperature controller for m...
Patent number
6,362,640
Issue date
Mar 26, 2002
Advanced Micro Devices, Inc.
Boon Hee Wee
G01 - MEASURING TESTING
Information
Patent Grant
Picker nest for holding an IC package with minimized stress on an I...
Patent number
6,344,737
Issue date
Feb 5, 2002
Advanced Micro Devices, Inc.
Thean Loy Yap
G01 - MEASURING TESTING
Information
Patent Grant
Picker nest for holding an IC package with minimized stress on an I...
Patent number
6,099,597
Issue date
Aug 8, 2000
Advanced Micro Devices, Inc.
Thean Loy Yap
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit boat retrieval mechanism
Patent number
5,947,258
Issue date
Sep 7, 1999
Advanced Micro Devices, Inc.
Thean Loy Yap
G01 - MEASURING TESTING