Boon Hor Lam

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatuses to wafer-level test adjacent semiconductor die
- Patent number 11,488,879
- Issue date Nov 1, 2022
- Micron Technology, Inc.
- Rajesh H. Kariya
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device with selective command delay and associated me...
- Patent number 11,468,960
- Issue date Oct 11, 2022
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device with power-saving mode and associated methods...
- Patent number 11,416,333
- Issue date Aug 16, 2022
- Micron Technology, Inc.
- Boon Hor Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses including temperature-based threshold voltage compensat...
- Patent number 11,335,385
- Issue date May 17, 2022
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for reducing access device sub-threshold le...
- Patent number 10,998,022
- Issue date May 4, 2021
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods to encode column plane compression data
- Patent number 10,937,517
- Issue date Mar 2, 2021
- Micron Technology, Inc.
- Eric J. Rich-Plotkin
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses including temperature-based threshold voltage compensat...
- Patent number 10,796,734
- Issue date Oct 6, 2020
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and apparatuses for stacked device testing
- Patent number 9,496,050
- Issue date Nov 15, 2016
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE WITH SELECTIVE COMMAND DELAY AND ASSOCIATED ME...
- Publication number 20230014661
- Publication date Jan 19, 2023
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE WITH POWER-SAVING MODE AND ASSOCIATED METHODS...
- Publication number 20220382628
- Publication date Dec 1, 2022
- Micron Technology, Inc.
- Boon Hor Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES INCLUDING TEMPERATURE-BASED THRESHOLD VOLTAGE COMPENSAT...
- Publication number 20220270654
- Publication date Aug 25, 2022
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE WITH SELECTIVE COMMAND DELAY AND ASSOCIATED ME...
- Publication number 20210202023
- Publication date Jul 1, 2021
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND APPARATUSES TO WAFER-LEVEL TEST ADJACENT SEMICONDUCTOR DIE
- Publication number 20210202328
- Publication date Jul 1, 2021
- Micron Technology, Inc.
- Rajesh H. Kariya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH POWER-SAVING MODE AND ASSOCIATED METHODS...
- Publication number 20210055986
- Publication date Feb 25, 2021
- Micron Technology, Inc.
- Boon Hor Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR REDUCING ACCESS DEVICE SUB-THRESHOLD LE...
- Publication number 20210050042
- Publication date Feb 18, 2021
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES INCLUDING TEMPERATURE-BASED THRESHOLD VOLTAGE COMPENSAT...
- Publication number 20210012818
- Publication date Jan 14, 2021
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND APPARATUSES FOR STACKED DEVICE TESTING
- Publication number 20140347944
- Publication date Nov 27, 2014
- Micron Technology, Inc.
- Boon Hor Lam
- G11 - INFORMATION STORAGE

Boon Hor Lam

Person

Patents Grantslast 30 patents

Methods and apparatuses to wafer-level test adjacent semiconductor die

Semiconductor device with selective command delay and associated me...

Semiconductor device with power-saving mode and associated methods...

Apparatuses including temperature-based threshold voltage compensat...

Apparatuses and methods for reducing access device sub-threshold le...

Apparatuses and methods to encode column plane compression data

Apparatuses including temperature-based threshold voltage compensat...

Methods and apparatuses for stacked device testing

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE WITH SELECTIVE COMMAND DELAY AND ASSOCIATED ME...

SEMICONDUCTOR DEVICE WITH POWER-SAVING MODE AND ASSOCIATED METHODS...

APPARATUSES INCLUDING TEMPERATURE-BASED THRESHOLD VOLTAGE COMPENSAT...

SEMICONDUCTOR DEVICE WITH SELECTIVE COMMAND DELAY AND ASSOCIATED ME...

METHODS AND APPARATUSES TO WAFER-LEVEL TEST ADJACENT SEMICONDUCTOR DIE

SEMICONDUCTOR DEVICE WITH POWER-SAVING MODE AND ASSOCIATED METHODS...

APPARATUSES AND METHODS FOR REDUCING ACCESS DEVICE SUB-THRESHOLD LE...

APPARATUSES INCLUDING TEMPERATURE-BASED THRESHOLD VOLTAGE COMPENSAT...

METHODS AND APPARATUSES FOR STACKED DEVICE TESTING