Boong Y. Cho

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Columbus, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for x-ray analysis of rapidly moving multicomp...
- Patent number 4,815,116
- Issue date Mar 21, 1989
- Process Automation Business, Inc.
- Boong Y. Cho
- G01 - MEASURING TESTING
Information Patent Grant
Thickness measurement with automatic correction for changes in comp...
- Patent number 4,803,715
- Issue date Feb 7, 1989
- Process Automation Business, Inc.
- Boong Y. Cho
- G01 - MEASURING TESTING
Information Patent Grant
Isotopic radiation method and apparatus for measuring the resinous...
- Patent number 4,599,514
- Issue date Jul 8, 1986
- AccuRay Corporation
- Boong Y. Cho
- G01 - MEASURING TESTING
Information Patent Grant
Spherical cavity method and apparatus for measuring a sheet materia...
- Patent number 4,052,615
- Issue date Oct 4, 1977
- Industrial Nucleonics Corporation
- Boong Youn Cho
- G01 - MEASURING TESTING