BORIS AFINOGENOV

Follow

Person

SUWON-SI, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Substrate inspection system and method of manufacturing semiconduct...
- Patent number 11,823,961
- Issue date Nov 21, 2023
- Samsung Electronics Co., Ltd.
- Eunhee Jeang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20240145315
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- EUNHEE JEANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE INSPECTION DEVICE BASED ON SPATIAL MODULATION METHOD AND P...
- Publication number 20220120662
- Publication date Apr 21, 2022
- Samsung Electronics Co., Ltd.
- Sangwoo BAE
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20210305106
- Publication date Sep 30, 2021
- Samsung Electronics Co., Ltd.
- EUNHEE JEANG
- H01 - BASIC ELECTRIC ELEMENTS