Boris Efraty

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Carmiel, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method of analyzing and utilizing landscapes to reduce or eliminate...
- Patent number 10,831,108
- Issue date Nov 10, 2020
- KLA Corporation
- Tal Marciano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Quality estimation and improvement of imaging metrology targets
- Patent number 10,408,602
- Issue date Sep 10, 2019
- KLA-Tencor Corporation
- Boris Efraty
- G01 - MEASURING TESTING
Information Patent Grant
Wafer notch detection
- Patent number 10,366,483
- Issue date Jul 30, 2019
- KLA-Tencor Corporation
- Boris Efraty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, system, and user interface for metrology target characteriz...
- Patent number 10,242,290
- Issue date Mar 26, 2019
- KLA-Tencor Corporation
- Inna Tarshish-Shapir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Removing process-variation-related inaccuracies from scatterometry...
- Patent number 9,874,527
- Issue date Jan 23, 2018
- KLA-Tencor Corporation
- Eran Amit
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF ANALYZING AND UTILIZING LANDSCAPES TO REDUCE OR ELIMINAT...
- Publication number 20160313658
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Tal Marciano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
QUALITY ESTIMATION AND IMPROVEMENT OF IMAGING METROLOGY TARGETS
- Publication number 20160231102
- Publication date Aug 11, 2016
- KLA-Tencor Corporation
- Boris Efraty
- G01 - MEASURING TESTING
Information Patent Application
WAFER NOTCH DETECTION
- Publication number 20160086325
- Publication date Mar 24, 2016
- KLA-Tencor Corporation
- Boris EFRATY
- G01 - MEASURING TESTING
Information Patent Application
REMOVING PROCESS-VARIATION-RELATED INACCURACIES FROM SCATTEROMETRY...
- Publication number 20150316490
- Publication date Nov 5, 2015
- KLA-Tencor Corporation
- Eran Amit
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY TARGET CHARACTERIZATION
- Publication number 20140136137
- Publication date May 15, 2014
- KLA-Tencor Corporation
- Inna Tarshish-Shapir
- G01 - MEASURING TESTING