Boris Golberg

Person

Ashdod, IL

People

Patents Grantslast 30 patents

Information Patent Grant
High throughput defect detection
- Patent number 12,092,584
- Issue date Sep 17, 2024
- Applied Materials Israel Ltd.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for obtaining information from a sample
- Patent number 11,448,601
- Issue date Sep 20, 2022
- Applied Materials Israel Ltd.
- Boris Golberg
- G02 - OPTICS
Information Patent Grant
Asymmetrical magnification inspection system and illumination module
- Patent number 10,481,101
- Issue date Nov 19, 2019
- Applied Materials Israel Ltd.
- Haim Feldman
- G02 - OPTICS
Information Patent Grant
Inspection system and method for inspecting a sample by using a plu...
- Patent number 10,054,551
- Issue date Aug 21, 2018
- Applied Materials Israel Ltd.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Grant
Scanning system and method for scanning an object
- Patent number 9,958,670
- Issue date May 1, 2018
- Applied Materials Israel Ltd.
- Ron Naftail
- G02 - OPTICS
Information Patent Grant
On-tool wavefront aberrations measurement system and method
- Patent number 9,395,266
- Issue date Jul 19, 2016
- Applied Materials Israel Ltd.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Grant
Broadband imaging system and method
- Patent number 7,403,336
- Issue date Jul 22, 2008
- Applied Materials, Israel, Ltd.
- Boris Golberg
- G02 - OPTICS
Information Patent Grant
System for inspecting a surface employing configurable multi angle...
- Patent number 7,315,364
- Issue date Jan 1, 2008
- Applied Materials, Israel, Ltd.
- Adam Baer
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 7,053,395
- Issue date May 30, 2006
- Applied Materials, Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 6,853,475
- Issue date Feb 8, 2005
- Applied Materials Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 6,809,808
- Issue date Oct 26, 2004
- Applied Materials, Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Focus error detection apparatus and method having dual focus error...
- Patent number 6,750,436
- Issue date Jun 15, 2004
- Applied Materials, Inc.
- Haim Feldman
- G02 - OPTICS
Information Patent Grant
Optical inspection method and apparatus utilizing a variable angle...
- Patent number 6,469,784
- Issue date Oct 22, 2002
- Applied Materials, Inc.
- Boris Golberg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION SYSTEMS WITH PULSED LIGHT SOURCES AND PULSE MULT...
- Publication number 20240280506
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Elad EIZNER
- G01 - MEASURING TESTING
Information Patent Application
LASER PULSE CASCADE
- Publication number 20240280802
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris GOLBERG
- G02 - OPTICS
Information Patent Application
POLARIZATION OPTICAL SYSTEM
- Publication number 20240255770
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris GOLBERG
- G01 - MEASURING TESTING
Information Patent Application
PHASE RETRIEVAL
- Publication number 20240230530
- Publication date Jul 11, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Benny Kirshner
- G01 - MEASURING TESTING
Information Patent Application
PHASE RETRIEVAL
- Publication number 20240133807
- Publication date Apr 25, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Benny Kirshner
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT DEFECT DETECTION
- Publication number 20230341334
- Publication date Oct 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OBTAINING INFORMATION FROM A SAMPLE
- Publication number 20210372936
- Publication date Dec 2, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Boris Golberg
- G02 - OPTICS
Information Patent Application
ASYMMETRICAL MAGNIFICATION INSPECTION SYSTEM AND ILLUMINATION MODULE
- Publication number 20180209915
- Publication date Jul 26, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Haim Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING SYSTEM AND METHOD FOR SCANNING AN OBJECT
- Publication number 20180081166
- Publication date Mar 22, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ron Naftail
- G02 - OPTICS
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING A SAMPLE BY USING A PLU...
- Publication number 20170307539
- Publication date Oct 26, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Application
ON-TOOL WAVEFRONT ABERRATIONS MEASUREMENT SYSTEM AND METHOD
- Publication number 20150300913
- Publication date Oct 22, 2015
- APPLIED MATERIALS ISRAEL LTD.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND IMAGING SYSTEM AND METHOD
- Publication number 20080100917
- Publication date May 1, 2008
- Applied Materials, Israel, Ltd.
- BORIS GOLBERG
- G02 - OPTICS
Information Patent Application
System for inspecting a surface employing configurable multi angle...
- Publication number 20060087648
- Publication date Apr 27, 2006
- Applied Materials Israel Ltd.
- Adam Baer
- G01 - MEASURING TESTING
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20040080740
- Publication date Apr 29, 2004
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20040075068
- Publication date Apr 22, 2004
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
FOCUS ERROR DETECTION APPARATUS AND METHOD
- Publication number 20040007659
- Publication date Jan 15, 2004
- Applied Materials Israel Ltd.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20030179369
- Publication date Sep 25, 2003
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
Optical inspection method and apparatus utilizing a variable angle...
- Publication number 20020005947
- Publication date Jan 17, 2002
- APPLIED MATERIALS, INC.
- Boris Golberg
- G01 - MEASURING TESTING

Boris Golberg

Person

Patents Grantslast 30 patents

High throughput defect detection

Method and system for obtaining information from a sample

Asymmetrical magnification inspection system and illumination module

Inspection system and method for inspecting a sample by using a plu...

Scanning system and method for scanning an object

On-tool wavefront aberrations measurement system and method

Broadband imaging system and method

System for inspecting a surface employing configurable multi angle...

Wafer defect detection system with traveling lens multi-beam scanner

Wafer defect detection system with traveling lens multi-beam scanner

Wafer defect detection system with traveling lens multi-beam scanner

Focus error detection apparatus and method having dual focus error...

Optical inspection method and apparatus utilizing a variable angle...

Patents Applicationslast 30 patents

OPTICAL INSPECTION SYSTEMS WITH PULSED LIGHT SOURCES AND PULSE MULT...

LASER PULSE CASCADE

POLARIZATION OPTICAL SYSTEM

PHASE RETRIEVAL

PHASE RETRIEVAL

HIGH THROUGHPUT DEFECT DETECTION

METHOD AND SYSTEM FOR OBTAINING INFORMATION FROM A SAMPLE

ASYMMETRICAL MAGNIFICATION INSPECTION SYSTEM AND ILLUMINATION MODULE

SCANNING SYSTEM AND METHOD FOR SCANNING AN OBJECT

INSPECTION SYSTEM AND METHOD FOR INSPECTING A SAMPLE BY USING A PLU...

ON-TOOL WAVEFRONT ABERRATIONS MEASUREMENT SYSTEM AND METHOD

BROADBAND IMAGING SYSTEM AND METHOD

System for inspecting a surface employing configurable multi angle...

Wafer defect detection system with traveling lens multi-beam scanner

Wafer defect detection system with traveling lens multi-beam scanner

FOCUS ERROR DETECTION APPARATUS AND METHOD

Wafer defect detection system with traveling lens multi-beam scanner

Optical inspection method and apparatus utilizing a variable angle...