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Boris Menchtchikov
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Cupertino, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for controlling a manufacturing process and associated appar...
Patent number
11,947,266
Issue date
Apr 2, 2024
ASML Netherlands B.V.
Nicolaas Petrus Marcus Brantjes
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for determining root cause affecting yield in a semiconducto...
Patent number
11,803,127
Issue date
Oct 31, 2023
ASML Netherlands B.V.
Chenxi Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to predict yield of a device manufacturing process
Patent number
11,714,357
Issue date
Aug 1, 2023
ASML Netherlands B.V.
Alexander Ypma
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method to predict yield of a device manufacturing process
Patent number
11,086,229
Issue date
Aug 10, 2021
ASML Netherlands B.V.
Alexander Ypma
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic method
Patent number
10,962,887
Issue date
Mar 30, 2021
ASML Netherlands B.V.
Patricius Aloysius Jacobus Tinnemans
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic method
Patent number
10,527,958
Issue date
Jan 7, 2020
ASML Netherlands B.V.
Patricius Aloysius Jacobus Tinnemans
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology method and apparatus
Patent number
9,903,823
Issue date
Feb 27, 2018
ASML Netherlands B.V.
Yen-Wen Lu
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
METHOD FOR CONTROLLING A MANUFACTURING PROCESS AND ASSOCIATED APPAR...
Publication number
20220026810
Publication date
Jan 27, 2022
ASML NETHERLANDS B.V.
Nicolaas Petrus Marcus BRANTJES
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS
Publication number
20220011728
Publication date
Jan 13, 2022
ASML NETHERLANDS B.V.
Youping ZHANG
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD OF MANUFACTURING DEVICES
Publication number
20210397172
Publication date
Dec 23, 2021
ASML NETHERLANDS B.V.
Abraham SLACHTER
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD FOR DETERMINING ROOT CAUSE AFFECTING YIELD IN A SEMICONDUCTO...
Publication number
20210389677
Publication date
Dec 16, 2021
ASML NETHERLANDS B.V.
Chenxi LIN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS
Publication number
20210325788
Publication date
Oct 21, 2021
ASML NETHERLANDS B.V.
Alexander YPMA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS
Publication number
20200103761
Publication date
Apr 2, 2020
ASML NETHERLANDS B.V.
Alexander YPMA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
LITHOGRAPHIC METHOD
Publication number
20200081356
Publication date
Mar 12, 2020
ASML NETHERLANDS B.V.
Patricius Aloysius Jacobus TINNEMANS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
LITHOGRAPHIC METHOD
Publication number
20190094721
Publication date
Mar 28, 2019
ASML NETHERLANDS B.V.
Patricius Aloysius Jacobus TINNEMANS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METROLOGY METHOD AND APPARATUS
Publication number
20160146740
Publication date
May 26, 2016
ASML NETHERLANDS B.V.
Yen-Wen Lu
G01 - MEASURING TESTING