Boris POVAZAY

Person

Wien, AT

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring device and method for determining the course of a bonding...
- Patent number 12,025,426
- Issue date Jul 2, 2024
- EV Group E. Thallner GmbH
- Dominik Zinner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for transferring a transfer layer
- Patent number 11,865,824
- Issue date Jan 9, 2024
- EV Group E. Thallner GmbH
- Venkata Raghavendra Subrahmanya Sarma Mokkapati
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for illuminating image points
- Patent number 11,681,228
- Issue date Jun 20, 2023
- EV Group E. Thallner GmbH
- Bernhard Thallner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device and method for separating a temporarily bonded substrate stack
- Patent number 11,534,868
- Issue date Dec 27, 2022
- EV Group E. Thallner GmbH
- Elisabeth Brandl
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and device for exposure of photosensitive layer
- Patent number 11,460,777
- Issue date Oct 4, 2022
- EV Group E. Thallner GmbH
- Bernhard Thallner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for aligning two optical subsystems
- Patent number 11,209,739
- Issue date Dec 28, 2021
- EV Group E. Thallner GmbH
- Boris Povazay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for embossing micro-structures and/or nano-structures
- Patent number 11,040,525
- Issue date Jun 22, 2021
- EV Group E. Thallner GmbH
- Jozsef Krol
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for exposure of photosensitive layer
- Patent number 10,852,528
- Issue date Dec 1, 2020
- EV Group E. Thallner GmbH
- Bernhard Thallner
- G02 - OPTICS
Information Patent Grant
Metrology device and metrology method
- Patent number 10,656,078
- Issue date May 19, 2020
- EV Group E. Thallner GmbH
- Martin Eibelhuber
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and method for ascertaining a pressure map
- Patent number 10,024,741
- Issue date Jul 17, 2018
- EV Group E. Thallner GmbH
- Boris Povazay
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR THE SEPARATION OF STRUCTURES FROM A SUBSTRATE
- Publication number 20230395418
- Publication date Dec 7, 2023
- EV GROUP E. THALLNER GMBH
- Boris Povazay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR THE EXPOSURE OF A PHOTOSENSITIVE COATING
- Publication number 20230251580
- Publication date Aug 10, 2023
- EV GROUP E. THALLNER GMBH
- Bernhard Thallner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND DEVICE FOR TRANSFERRING A TRANSFER LAYER
- Publication number 20230211592
- Publication date Jul 6, 2023
- EV GROUP E. THALLNER GMBH
- Venkata Raghavendra Subrahmanya Sarma Mokkapati
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MEASURING DEVICE AND METHOD FOR DETERMINING THE COURSE OF A BONDING...
- Publication number 20220026196
- Publication date Jan 27, 2022
- EV GROUP E. THALLNER GMBH
- Dominik ZINNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ILLUMINATING IMAGE POINTS
- Publication number 20210247697
- Publication date Aug 12, 2021
- EV GROUP E. THALLNER GMBH
- Bernhard Thallner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEVICE AND METHOD FOR SEPARATING A TEMPORARILY BONDED SUBSTRATE STACK
- Publication number 20210060710
- Publication date Mar 4, 2021
- EV GROUP E. THALLNER GMBH
- Elisabeth BRANDL
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND APPARATUS FOR ALIGNING TWO OPTICAL SUBSYSTEMS
- Publication number 20200174383
- Publication date Jun 4, 2020
- EV GROUP E. THALLNER GMBH
- Boris Povazay
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND DEVICE FOR EXPOSURE OF PHOTOSENSITIVE LAYER
- Publication number 20200089121
- Publication date Mar 19, 2020
- EV GROUP E. THALLNER GMBH
- Bernhard Thallner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR EMBOSSING MICRO-STRUCTURES AND/OR NANO-STRUCTURES
- Publication number 20200070496
- Publication date Mar 5, 2020
- EV GROUP E. THALLNER GMBH
- Jozsef Krol
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
METHOD AND DEVICE FOR EXPOSURE OF PHOTOSENSITIVE LAYER
- Publication number 20190293924
- Publication date Sep 26, 2019
- EV GROUP E. THALLNER GMBH
- Bernhard Thallner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY DEVICE AND METROLOGY METHOD
- Publication number 20190025194
- Publication date Jan 24, 2019
- EV GROUP E. THALLNER GMBH
- Martin Eibelhuber
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND METHOD FOR ASCERTAINING A PRESSURE MAP
- Publication number 20160103026
- Publication date Apr 14, 2016
- EV GROUP E. THALLNER GMBH
- Boris POVAZAY
- G01 - MEASURING TESTING

Boris POVAZAY

Person

Patents Grantslast 30 patents

Measuring device and method for determining the course of a bonding...

Method and device for transferring a transfer layer

Method and apparatus for illuminating image points

Device and method for separating a temporarily bonded substrate stack

Method and device for exposure of photosensitive layer

Method and apparatus for aligning two optical subsystems

Method for embossing micro-structures and/or nano-structures

Method and device for exposure of photosensitive layer

Metrology device and metrology method

Measuring device and method for ascertaining a pressure map

Patents Applicationslast 30 patents

METHOD FOR THE SEPARATION OF STRUCTURES FROM A SUBSTRATE

METHOD AND DEVICE FOR THE EXPOSURE OF A PHOTOSENSITIVE COATING

METHOD AND DEVICE FOR TRANSFERRING A TRANSFER LAYER

MEASURING DEVICE AND METHOD FOR DETERMINING THE COURSE OF A BONDING...

METHOD AND APPARATUS FOR ILLUMINATING IMAGE POINTS

DEVICE AND METHOD FOR SEPARATING A TEMPORARILY BONDED SUBSTRATE STACK

METHOD AND APPARATUS FOR ALIGNING TWO OPTICAL SUBSYSTEMS

METHOD AND DEVICE FOR EXPOSURE OF PHOTOSENSITIVE LAYER

METHOD FOR EMBOSSING MICRO-STRUCTURES AND/OR NANO-STRUCTURES

METHOD AND DEVICE FOR EXPOSURE OF PHOTOSENSITIVE LAYER

METROLOGY DEVICE AND METROLOGY METHOD

MEASURING DEVICE AND METHOD FOR ASCERTAINING A PRESSURE MAP