Boris Sherman

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Monitoring system and method for verifying measurements in patterne...
- Patent number 12,152,869
- Issue date Nov 26, 2024
- Nova Ltd.
- Boaz Brill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring system and method for verifying measurements in patterne...
- Patent number 10,295,329
- Issue date May 21, 2019
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method for defect detection including patch-to-patch...
- Patent number 9,367,911
- Issue date Jun 14, 2016
- Applied Materials Israel, Ltd.
- Michele Dalla-Torre
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20240428396
- Publication date Dec 26, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris SHERMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20240338811
- Publication date Oct 10, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehonatan Hai OFIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE AUGMENTATION FOR MACHINE LEARNING BASED DEFECT EXAMINATION
- Publication number 20240095903
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris SHERMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN
- Publication number 20240078659
- Publication date Mar 7, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehonatan Hai OFIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Monitoring system and method for verifying measurements in pattened...
- Publication number 20220163320
- Publication date May 26, 2022
- NOVA LTD
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
MONITORING SYSTEM AND METHOD FOR VERIFYING MEASUREMENTS IN PATTENED...
- Publication number 20190339056
- Publication date Nov 7, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Monitoring system and method for verifying measurements in patterne...
- Publication number 20140195194
- Publication date Jul 10, 2014
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DEFECT DETECTION INCLUDING PATCH-TO-PATCH...
- Publication number 20130336573
- Publication date Dec 19, 2013
- APPLIED MATERIALS ISRAEL LTD.
- Michele Dalla-Torre
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR USE IN MEASURING IN COMPLEX PATTERNED STRUCTURES
- Publication number 20130282343
- Publication date Oct 24, 2013
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING IN PATTERNED STRUCTURES
- Publication number 20130124141
- Publication date May 16, 2013
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G01 - MEASURING TESTING

Boris Sherman

Person

Patents Grantslast 30 patents

Monitoring system and method for verifying measurements in patterne...

Monitoring system and method for verifying measurements in patterne...

Apparatus and method for defect detection including patch-to-patch...

Patents Applicationslast 30 patents

MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS

MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS

IMAGE AUGMENTATION FOR MACHINE LEARNING BASED DEFECT EXAMINATION

DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN

Monitoring system and method for verifying measurements in pattened...

MONITORING SYSTEM AND METHOD FOR VERIFYING MEASUREMENTS IN PATTENED...

Monitoring system and method for verifying measurements in patterne...

APPARATUS AND METHOD FOR DEFECT DETECTION INCLUDING PATCH-TO-PATCH...

METHOD AND SYSTEM FOR USE IN MEASURING IN COMPLEX PATTERNED STRUCTURES

METHOD AND SYSTEM FOR MEASURING IN PATTERNED STRUCTURES