Boris SIMKHOVICH

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Haifa, IL

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Patents Grantslast 30 patents

Information Patent Grant
System and method for monitoring status of target
- Patent number 11,519,864
- Issue date Dec 6, 2022
- Technion Research & Development Foundation Limited
- Boris Simkhovich
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING A SEMICONDUCTOR DEVICE USING X-RAYS
- Publication number 20240103072
- Publication date Mar 28, 2024
- Intel Corporation
- Patrick PARDY
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MONITORING STATUS OF TARGET
- Publication number 20210072163
- Publication date Mar 11, 2021
- Technion Research & Development Foundation Limited
- Boris SIMKHOVICH
- G01 - MEASURING TESTING