Boris Yokhin

Person

Nazareth Illit, IL

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection of bumps on a semiconductor substrate
- Patent number 9,390,984
- Issue date Jul 12, 2016
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,731,138
- Issue date May 20, 2014
- Jordan Valley Semiconductor Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Fast measurement of X-ray diffraction from tilted layers
- Patent number 8,437,450
- Issue date May 7, 2013
- Jordan Valley Semiconductors Ltd.
- John Wall
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,243,878
- Issue date Aug 14, 2012
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Accurate measurement of layer dimensions using XRF
- Patent number 7,804,934
- Issue date Sep 28, 2010
- Jordan Valley Semiconductors Ltd.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Grant
X-ray measurement of properties of nano-particles
- Patent number 7,680,243
- Issue date Mar 16, 2010
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of small features using X-ray fluorescence
- Patent number 7,653,174
- Issue date Jan 26, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Automated selection of X-ray reflectometry measurement locations
- Patent number 7,649,978
- Issue date Jan 19, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Target alignment for X-ray scattering measurements
- Patent number 7,600,916
- Issue date Oct 13, 2009
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Multifunction X-ray analysis system
- Patent number 7,551,719
- Issue date Jun 23, 2009
- Jordan Valley Semiconductord Ltd
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Overlay metrology using X-rays
- Patent number 7,481,579
- Issue date Jan 27, 2009
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement of properties of thin films on sidewalls
- Patent number 7,483,513
- Issue date Jan 27, 2009
- Jordan Valley Semiconductors, Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of X-ray reflectometry system
- Patent number 7,474,732
- Issue date Jan 6, 2009
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Multi-detector EDXRD
- Patent number 7,321,652
- Issue date Jan 22, 2008
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Detection of dishing and tilting using X-ray fluorescence
- Patent number 7,245,695
- Issue date Jul 17, 2007
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Efficient measurement of diffuse X-ray reflections
- Patent number 7,231,016
- Issue date Jun 12, 2007
- Jordan Valley Applied Radiation, Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Combined X-ray reflectometer and diffractometer
- Patent number 7,120,228
- Issue date Oct 10, 2006
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing resolution of X-ray measurements by sample motion
- Patent number 7,113,566
- Issue date Sep 26, 2006
- Jordan Valley Applied Radiation Ltd.
- Asher Peled
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of critical dimensions using X-ray diffraction in refle...
- Patent number 7,110,491
- Issue date Sep 19, 2006
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Material analysis using multiple X-ray reflectometry models
- Patent number 7,103,142
- Issue date Sep 5, 2006
- Jordan Valley Applied Radiation Ltd.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus with dual monochromators
- Patent number 7,076,024
- Issue date Jul 11, 2006
- Jordan Valley Applied Radiation, Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Enhancement of X-ray reflectometry by measurement of diffuse reflec...
- Patent number 7,068,753
- Issue date Jun 27, 2006
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scattering with a polychromatic source
- Patent number 7,035,375
- Issue date Apr 25, 2006
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Beam centering and angle calibration for X-ray reflectometry
- Patent number 6,947,520
- Issue date Sep 20, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Dual-wavelength x-ray monochromator
- Patent number 6,907,108
- Issue date Jun 14, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
XRR detector readout processing
- Patent number 6,895,071
- Issue date May 17, 2005
- Jordon Valley Applied Radiation, Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry with small-angle scattering measurement
- Patent number 6,895,075
- Issue date May 17, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Dual-wavelength X-ray reflectometry
- Patent number 6,680,996
- Issue date Jan 20, 2004
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of critical dimensions using X-rays
- Patent number 6,556,652
- Issue date Apr 29, 2003
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed X-ray reflectometer
- Patent number 6,535,575
- Issue date Mar 18, 2003
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-ray inspection of bumps on a semiconductor substrate
- Publication number 20130089178
- Publication date Apr 11, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20120281814
- Publication date Nov 8, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS
- Publication number 20120140889
- Publication date Jun 7, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- John Wall
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20110164730
- Publication date Jul 7, 2011
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Automated selection of x-ray reflectometry measurement locations
- Publication number 20090074141
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF
- Publication number 20090074137
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Application
X-ray measurement of properties of nano-particles
- Publication number 20090067573
- Publication date Mar 12, 2009
- JORDAN VALLEY SEMICONDUCTORS
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Inspection of small features using X-Ray fluorescence
- Publication number 20080159475
- Publication date Jul 3, 2008
- JORDAN VALLEY SEMICONDUCTORS
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Target alignment for x-ray scattering measurements
- Publication number 20070286344
- Publication date Dec 13, 2007
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Automated selection of X-ray reflectometry measurement locations
- Publication number 20070274447
- Publication date Nov 29, 2007
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Overlay metrology using X-rays
- Publication number 20070224518
- Publication date Sep 27, 2007
- Boris Yokhin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTI-DETECTOR EDXRD
- Publication number 20070058779
- Publication date Mar 15, 2007
- Boris YOKHIN
- G01 - MEASURING TESTING
Information Patent Application
Measurement of properties of thin films on sidewalls
- Publication number 20060274886
- Publication date Dec 7, 2006
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Detection of dishing and tilting using x-ray fluorescence
- Publication number 20060227931
- Publication date Oct 12, 2006
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL ANALYSIS USING MULTIPLE X-RAY REFLECTOMETRY MODELS
- Publication number 20060188062
- Publication date Aug 24, 2006
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Application
Efficient measurement of diffuse X-ray reflections
- Publication number 20060182220
- Publication date Aug 17, 2006
- David Berman
- G01 - MEASURING TESTING
Information Patent Application
Measurement of critical dimensions using X-ray diffraction in refle...
- Publication number 20060133570
- Publication date Jun 22, 2006
- JORDAN VALLEY APPLIED RADIATION LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Calibration of X-ray reflectometry system
- Publication number 20060115046
- Publication date Jun 1, 2006
- David Berman
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS WITH DUAL MONOCHROMATORS
- Publication number 20060115047
- Publication date Jun 1, 2006
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Multifunction X-ray analysis system
- Publication number 20060062351
- Publication date Mar 23, 2006
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Combined X-ray reflectometer and diffractometer
- Publication number 20060062350
- Publication date Mar 23, 2006
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Enhancement of X-ray reflectometry by measurement of diffuse reflec...
- Publication number 20060023836
- Publication date Feb 2, 2006
- David Berman
- G01 - MEASURING TESTING
Information Patent Application
X-ray scattering with a polychromatic source
- Publication number 20050094766
- Publication date May 5, 2005
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
X-ray reflectometry with small-angle scattering measurement
- Publication number 20040156474
- Publication date Aug 12, 2004
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Dual-wavelength x-ray monochromator
- Publication number 20040151278
- Publication date Aug 5, 2004
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Beam centering and angle calibration for X-ray reflectometry
- Publication number 20040109531
- Publication date Jun 10, 2004
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
X-ray reflectometer
- Publication number 20040028186
- Publication date Feb 12, 2004
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Dual-wavelength X-ray reflectometry
- Publication number 20030156682
- Publication date Aug 21, 2003
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
X-ray reflectometer
- Publication number 20030072413
- Publication date Apr 17, 2003
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
WAFER WITH OVERLAY TEST PATTERN
- Publication number 20030002620
- Publication date Jan 2, 2003
- Isaac Mazor
- G01 - MEASURING TESTING

Boris Yokhin

Person

Patents Grantslast 30 patents

X-ray inspection of bumps on a semiconductor substrate

High-resolution X-ray diffraction measurement with enhanced sensiti...

Fast measurement of X-ray diffraction from tilted layers

High-resolution X-ray diffraction measurement with enhanced sensiti...

Accurate measurement of layer dimensions using XRF

X-ray measurement of properties of nano-particles

Inspection of small features using X-ray fluorescence

Automated selection of X-ray reflectometry measurement locations

Target alignment for X-ray scattering measurements

Multifunction X-ray analysis system

Overlay metrology using X-rays

Measurement of properties of thin films on sidewalls

Calibration of X-ray reflectometry system

Multi-detector EDXRD

Detection of dishing and tilting using X-ray fluorescence

Efficient measurement of diffuse X-ray reflections

Combined X-ray reflectometer and diffractometer

Enhancing resolution of X-ray measurements by sample motion

Measurement of critical dimensions using X-ray diffraction in refle...

Material analysis using multiple X-ray reflectometry models

X-ray apparatus with dual monochromators

Enhancement of X-ray reflectometry by measurement of diffuse reflec...

X-ray scattering with a polychromatic source

Beam centering and angle calibration for X-ray reflectometry

Dual-wavelength x-ray monochromator

XRR detector readout processing

X-ray reflectometry with small-angle scattering measurement

Dual-wavelength X-ray reflectometry

Measurement of critical dimensions using X-rays

Pulsed X-ray reflectometer

Patents Applicationslast 30 patents

X-ray inspection of bumps on a semiconductor substrate

High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...

FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS

High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...

Automated selection of x-ray reflectometry measurement locations

ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF

X-ray measurement of properties of nano-particles

Inspection of small features using X-Ray fluorescence

Target alignment for x-ray scattering measurements

Automated selection of X-ray reflectometry measurement locations

Overlay metrology using X-rays

MULTI-DETECTOR EDXRD

Measurement of properties of thin films on sidewalls

Detection of dishing and tilting using x-ray fluorescence

MATERIAL ANALYSIS USING MULTIPLE X-RAY REFLECTOMETRY MODELS

Efficient measurement of diffuse X-ray reflections

Measurement of critical dimensions using X-ray diffraction in refle...

Calibration of X-ray reflectometry system

X-RAY APPARATUS WITH DUAL MONOCHROMATORS

Multifunction X-ray analysis system

Combined X-ray reflectometer and diffractometer

Enhancement of X-ray reflectometry by measurement of diffuse reflec...

X-ray scattering with a polychromatic source

X-ray reflectometry with small-angle scattering measurement

Dual-wavelength x-ray monochromator

Beam centering and angle calibration for X-ray reflectometry

X-ray reflectometer

Dual-wavelength X-ray reflectometry

X-ray reflectometer

WAFER WITH OVERLAY TEST PATTERN