Boris Zapesochini

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Jerusalem, IL

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Patents Grantslast 30 patents

Information Patent Grant
Connection quality verification for integrated circuit test
- Patent number 9,097,758
- Issue date Aug 4, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Yefim-Haim Fefer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONNECTION QUALITY VERIFICATION FOR INTEGRATED CIRCUIT TEST
- Publication number 20120038367
- Publication date Feb 16, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Yefim-Haim Fefer
- G01 - MEASURING TESTING