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Boryau (Jack) Sheu
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for pipelined scan compression
Patent number
7,945,833
Issue date
May 17, 2011
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
Compacting test responses using X-driven compactor
Patent number
7,779,322
Issue date
Aug 17, 2010
Syntest Technologies, Inc.
Zhigang Wang
G01 - MEASURING TESTING
Information
Patent Grant
Mask network design for scan-based integrated circuits
Patent number
7,735,049
Issue date
Jun 8, 2010
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for broadcasting test patterns in a scan-based...
Patent number
7,721,172
Issue date
May 18, 2010
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for pipelined scan compression
Patent number
7,590,905
Issue date
Sep 15, 2009
Syntest Technologies, Inc.
Khader S. Abdel-Hafez
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for shifting at-speed scan patterns in a scan-...
Patent number
7,512,851
Issue date
Mar 31, 2009
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for broadcasting test patterns in a scan based...
Patent number
7,412,637
Issue date
Aug 12, 2008
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for multi-level scan compression
Patent number
7,231,570
Issue date
Jun 12, 2007
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method for performing ATPG and fault simulation in a scan-based int...
Patent number
7,210,082
Issue date
Apr 24, 2007
Syntest Technologies, Inc.
Khader S. Abdel-Hafez
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Smart capture for ATPG (automatic test pattern generation) and faul...
Patent number
7,124,342
Issue date
Oct 17, 2006
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Mask network design for scan-based integrated circuits
Patent number
7,032,148
Issue date
Apr 18, 2006
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for broadcasting scan patterns in a random acc...
Publication number
20080276143
Publication date
Nov 6, 2008
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for broadcasting scan patterns in a random acc...
Publication number
20060242502
Publication date
Oct 26, 2006
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Application
Mask network design for scan-based integrated circuits
Publication number
20060156122
Publication date
Jul 13, 2006
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for pipelined scan compression
Publication number
20060064614
Publication date
Mar 23, 2006
Khader S. Abdel-Hafez
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for multi-level scan compression
Publication number
20050268194
Publication date
Dec 1, 2005
Laung-Terng (L.T.) Wang
G01 - MEASURING TESTING
Information
Patent Application
Smart capture for ATPG (automatic test pattern generation) and faul...
Publication number
20050262409
Publication date
Nov 24, 2005
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Mask network design for scan-based integrated circuits
Publication number
20050060625
Publication date
Mar 17, 2005
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for shifting at-speed scan patterns in a scan-...
Publication number
20050055617
Publication date
Mar 10, 2005
Laung-Terng Wang
G01 - MEASURING TESTING