Botser RESHEF

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Shoham, IL

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Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20240428396
- Publication date Dec 26, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris SHERMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE AUGMENTATION FOR MACHINE LEARNING BASED DEFECT EXAMINATION
- Publication number 20240095903
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris SHERMAN
- G06 - COMPUTING CALCULATING COUNTING