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Bowei Hsieh
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Taipei Hsien, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for testing chips
Patent number
8,694,839
Issue date
Apr 8, 2014
VIA Technologies Inc.
Hsiang-Che Hsu
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for testing chips
Patent number
7,853,843
Issue date
Dec 14, 2010
VIA Technologies Inc.
Hsiang-Che Hsu
G01 - MEASURING TESTING
Information
Patent Grant
Method and related apparatus for accessing memory
Patent number
7,779,215
Issue date
Aug 17, 2010
VIA Technologies Inc.
Ming-Shi Liou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and related apparatus for adjusting timing of memory signals
Patent number
7,444,535
Issue date
Oct 28, 2008
VIA Technologies Inc.
Bowei Hsieh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for adjusting timing of memory signals
Patent number
7,418,617
Issue date
Aug 26, 2008
VIA Technologies Inc.
Bowei Hsieh
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND SYSTEM FOR TESTING CHIPS
Publication number
20110047420
Publication date
Feb 24, 2011
Hsiang-Che Hsu
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR TESTING CHIPS
Publication number
20080104463
Publication date
May 1, 2008
Hsiang-Che Hsu
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for Adjusting Timing of Memory Signals
Publication number
20070214378
Publication date
Sep 13, 2007
Bowei Hsieh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND RELATED APPARATUS FOR ADJUSTING TIMING OF MEMORY SIGNALS
Publication number
20060080565
Publication date
Apr 13, 2006
Bowei Hsieh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND RELATED APPARATUS FOR ACCESSING MEMORY
Publication number
20050289317
Publication date
Dec 29, 2005
Ming-Shi Liou
G06 - COMPUTING CALCULATING COUNTING