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Bowei Zhang
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for improved camera color calibration
Patent number
11,729,371
Issue date
Aug 15, 2023
Ford Global Technologies, LLC
Christopher N. St. John
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for active depth imager with background subtract
Patent number
10,582,178
Issue date
Mar 3, 2020
OmniVision Technologies, Inc.
Zheng Yang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods for high-throughput fluorescence imaging with sample heatin...
Patent number
10,451,551
Issue date
Oct 22, 2019
OmniVision Technologies, Inc.
Bowei Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for single-photon avalanche-photodiode detecto...
Patent number
10,312,391
Issue date
Jun 4, 2019
OmniVision Technologies, Inc.
Gang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stacked-chip backside-illuminated SPAD sensor with high fill-factor
Patent number
10,153,310
Issue date
Dec 11, 2018
OmniVision Technologies, Inc.
Bowei Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Vertical gate guard ring for single photon avalanche diode pitch mi...
Patent number
10,141,458
Issue date
Nov 27, 2018
OmniVision Technologies, Inc.
Bowei Zhang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Imaging systems with single-photon-avalanche-diodes and sensor tran...
Patent number
9,628,735
Issue date
Apr 18, 2017
OmniVision Technologies, Inc.
Bowei Zhang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
High-throughput fluorescence imaging system and device with sample...
Patent number
9,574,991
Issue date
Feb 21, 2017
OmniVision Technologies, Inc.
Bowei Zhang
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Enhanced photon detection device with biased deep trench isolation
Patent number
9,160,949
Issue date
Oct 13, 2015
OmniVision Technologies, Inc.
Bowei Zhang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
Systems and Methods for Improved Camera Color Calibration
Publication number
20220116584
Publication date
Apr 14, 2022
ARGO AI, LLC
Christopher N. St. John
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems And Methods For Active Depth Imager With Background Subtract
Publication number
20180124372
Publication date
May 3, 2018
OMNIVISION TECHNOLOGIES, INC.
Zheng Yang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Apparatus And Method For Single-Photon Avalanche-Photodiode Detecto...
Publication number
20180097132
Publication date
Apr 5, 2018
Gang CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VERTICAL GATE GUARD RING FOR SINGLE PHOTON AVALANCHE DIODE PITCH MI...
Publication number
20180026147
Publication date
Jan 25, 2018
OMNIVISION TECHNOLOGIES, INC.
Bowei Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STACKED-CHIP BACKSIDE-ILLUMINATED SPAD SENSOR WITH HIGH FILL-FACTOR
Publication number
20180019268
Publication date
Jan 18, 2018
OMNIVISION TECHNOLOGIES, INC.
Bowei Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS FOR HIGH-THROUGHPUT FLUORESCENCE IMAGING WITH SAMPLE HEATIN...
Publication number
20170167978
Publication date
Jun 15, 2017
OMNIVISION TECHNOLOGIES, INC.
Bowei Zhang
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
Imaging Systems With Single-Photon-Avalanche-Diodes And Sensor Tran...
Publication number
20160373676
Publication date
Dec 22, 2016
OmniVision Technolgies, Inc.
Bowei Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Color-Sensitive Image Sensor With Embedded Microfluidics And Associ...
Publication number
20160116409
Publication date
Apr 28, 2016
OMNIVISION TECHNOLOGIES, INC.
Dominic Massetti
G01 - MEASURING TESTING
Information
Patent Application
HIGH-THROUGHPUT FLUORESCENCE IMAGING SYSTEM AND DEVICE WITH SAMPLE...
Publication number
20160103068
Publication date
Apr 14, 2016
OMNIVISION TECHNOLOGIES, INC.
Bowei Zhang
G01 - MEASURING TESTING
Information
Patent Application
ENHANCED PHOTON DETECTION DEVICE WITH BIASED DEEP TRENCH ISOLATION
Publication number
20140291481
Publication date
Oct 2, 2014
OMNIVISION TECHNOLOGIES, INC.
Bowei Zhang
H01 - BASIC ELECTRIC ELEMENTS