Brad Larson

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Artificial intelligence enabled metrology
- Patent number 12,293,525
- Issue date May 6, 2025
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Artificial intelligence-enabled preparation end-pointing
- Patent number 11,847,813
- Issue date Dec 19, 2023
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parameter estimation for metrology of features in an image
- Patent number 11,569,056
- Issue date Jan 31, 2023
- FEI Company
- Brad Larson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Line-based endpoint detection
- Patent number 11,355,313
- Issue date Jun 7, 2022
- FEI Company
- Brian Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Artificial intelligence-enabled preparation end-pointing
- Patent number 11,176,656
- Issue date Nov 16, 2021
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charge reduction by digital image correlation
- Patent number 10,614,998
- Issue date Apr 7, 2020
- FEI Company
- Remco Geurts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stacking integrated circuit dies
- Patent number 7,772,708
- Issue date Aug 10, 2010
- Intel Corporation
- Michael Leddige
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20240071040
- Publication date Feb 29, 2024
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Artificial Intelligence Enabled Metrology
- Publication number 20230034667
- Publication date Feb 2, 2023
- FEI Company
- John FLANAGAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20220067915
- Publication date Mar 3, 2022
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LINE-BASED ENDPOINT DETECTION
- Publication number 20210407765
- Publication date Dec 30, 2021
- FEI Company
- Brian Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORRELATED SLICE AND VIEW IMAGE ANNOTATION FOR MACHINE LEARNING
- Publication number 20210374467
- Publication date Dec 2, 2021
- FEI Company
- Derek Higgins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSE ESTIMATION USING SEMATIC SEGMENTATION
- Publication number 20210088770
- Publication date Mar 25, 2021
- FEI Company
- John FLANAGAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20200279362
- Publication date Sep 3, 2020
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARAMETER ESTIMATION FOR METROLOGY OF FEATURES IN AN IMAGE
- Publication number 20200161083
- Publication date May 21, 2020
- FEI Company
- Brad LARSON
- G01 - MEASURING TESTING
Information Patent Application
Artificial Intelligence Enabled Metrology
- Publication number 20200134829
- Publication date Apr 30, 2020
- FEI Company
- John FLANAGAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGE REDUCTION BY DIGITAL IMAGE CORRELATION
- Publication number 20190348256
- Publication date Nov 14, 2019
- FEI Company
- Remco Geurts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and arrangements for interconnecting integrated circuit dies
- Publication number 20080054493
- Publication date Mar 6, 2008
- Michael Leddige
- H01 - BASIC ELECTRIC ELEMENTS

Brad Larson

Person

Patents Grantslast 30 patents

Artificial intelligence enabled metrology

Artificial intelligence-enabled preparation end-pointing

Parameter estimation for metrology of features in an image

Line-based endpoint detection

Artificial intelligence-enabled preparation end-pointing

Charge reduction by digital image correlation

Stacking integrated circuit dies

Patents Applicationslast 30 patents

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

Artificial Intelligence Enabled Metrology

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

LINE-BASED ENDPOINT DETECTION

CORRELATED SLICE AND VIEW IMAGE ANNOTATION FOR MACHINE LEARNING

POSE ESTIMATION USING SEMATIC SEGMENTATION

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

PARAMETER ESTIMATION FOR METROLOGY OF FEATURES IN AN IMAGE

Artificial Intelligence Enabled Metrology

CHARGE REDUCTION BY DIGITAL IMAGE CORRELATION

Systems and arrangements for interconnecting integrated circuit dies