Bradford G. Van Treuren

Person

Lambertville, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for dynamic scan scheduling
- Patent number 9,183,105
- Issue date Nov 10, 2015
- Alcatel Lucent
- Michele Portolan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for position-based scheduling for JTAG systems
- Patent number 8,775,884
- Issue date Jul 8, 2014
- Alcatel Lucent
- Michele Portolan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for deferred scheduling for JTAG systems
- Patent number 8,719,649
- Issue date May 6, 2014
- Alcatel Lucent
- Michele Portolan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for system testing using multiple processors
- Patent number 8,677,198
- Issue date Mar 18, 2014
- Alcatel Lucent
- Suresh Goyal
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for virtual in-circuit emulation
- Patent number 8,621,301
- Issue date Dec 31, 2013
- Alcatel Lucent
- Suresh Goyal
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for system testing using multiple instruction...
- Patent number 8,533,545
- Issue date Sep 10, 2013
- Alcatel Lucent
- Suresh Goyal
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for providing scan chain security
- Patent number 8,495,758
- Issue date Jul 23, 2013
- Alcatel Lucent
- Suresh Goyal
- G01 - MEASURING TESTING
Information Patent Grant
Distributed base station test bus architecture in a wireless network
- Patent number 8,014,753
- Issue date Sep 6, 2011
- Alcatel Lucent
- Ken L. Cheung
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for describing components adapted for dynamica...
- Patent number 7,962,885
- Issue date Jun 14, 2011
- Alcatel-Lucent USA Inc.
- Tapan J. Chakraborty
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for describing and testing a system-on-chip
- Patent number 7,958,479
- Issue date Jun 7, 2011
- Alcatel-Lucent USA Inc.
- Tapan J. Chakraborty
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for isolating portions of a scan path of a sys...
- Patent number 7,958,417
- Issue date Jun 7, 2011
- Alcatel-Lucent USA Inc.
- Tapan Chakraborty
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for controlling dynamic modification of a scan...
- Patent number 7,954,022
- Issue date May 31, 2011
- Alcatel-Lucent USA Inc.
- Tapan Chakraborty
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for describing parallel access to a system-on-...
- Patent number 7,949,915
- Issue date May 24, 2011
- Alcatel-Lucent USA Inc.
- Tapan J. Chakraborty
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board testing system using free space optical communications
- Patent number 7,863,912
- Issue date Jan 4, 2011
- Alcatel-Lucent USA Inc.
- Charles Calvin Byers
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test vector manager, method of managing test vectors and a test too...
- Patent number 7,457,987
- Issue date Nov 25, 2008
- Lucent Technologies Inc.
- Antonio L. Franco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for adaptable testing of backplane interconnectio...
- Patent number 7,265,556
- Issue date Sep 4, 2007
- Lucent Technologies Inc.
- Bradford G. Van Treuren
- G01 - MEASURING TESTING
Information Patent Grant
System for flexible embedded Boundary Scan testing
- Patent number 7,149,943
- Issue date Dec 12, 2006
- Lucent Technologies Inc.
- Bradford G. Van Treuren
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for testing cluster circuits in a boundary scan e...
- Patent number 6,378,094
- Issue date Apr 23, 2002
- Lucent Technologies Inc.
- Tapan Jyoti Chakraborty
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for fault detection in circuit interconnections
- Patent number 6,167,542
- Issue date Dec 26, 2000
- Lucent Technologies
- Tapan Jyoti Chakraborty
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving robot accuracy
- Patent number 5,105,368
- Issue date Apr 14, 1992
- AT&T Bell Laboratories
- John B. Alexandersen
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DYNAMIC SCAN SCHEDULING
- Publication number 20140223237
- Publication date Aug 7, 2014
- ALCATEL LUCENT
- Michele Portolan
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR POSITION-BASED SCHEDULING FOR JTAG SYSTEMS
- Publication number 20120137186
- Publication date May 31, 2012
- Michele Portolan
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SYSTEM TESTING USING MULTIPLE INSTRUCTION...
- Publication number 20100229036
- Publication date Sep 9, 2010
- Suresh Goyal
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING DYNAMIC MODIFICATION OF A SCAN...
- Publication number 20090193306
- Publication date Jul 30, 2009
- Tapan Chakraborty
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Isolating Portions of a Scan Path of a Sys...
- Publication number 20090193304
- Publication date Jul 30, 2009
- Tapan Chakraborty
- G01 - MEASURING TESTING
Information Patent Application
Circuit board testing system
- Publication number 20090140755
- Publication date Jun 4, 2009
- Lucent Technologies, Inc.
- Charles Calvin Byers
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and Apparatus for Describing Components Adapted for Dynamica...
- Publication number 20090144592
- Publication date Jun 4, 2009
- Tapan J. Chakraborty
- G01 - MEASURING TESTING
Information Patent Application
Test vector manager, method of managing test vectors and a test too...
- Publication number 20070214392
- Publication date Sep 13, 2007
- Lucent Technologies Inc.
- Antonio L. Franco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for adaptable testing of backplane interconnectio...
- Publication number 20070069737
- Publication date Mar 29, 2007
- Lucent Technologies Inc.
- Bradford G. Van Treuren
- G01 - MEASURING TESTING
Information Patent Application
System and method for emulating hardware failures and method of tes...
- Publication number 20070032999
- Publication date Feb 8, 2007
- Lucent Technologies Inc.
- Eric J. Bauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Distributed base station test bus architecture in a wireless network
- Publication number 20060013146
- Publication date Jan 19, 2006
- Ken L. Cheung
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System for flexible embedded Boundary Scan testing
- Publication number 20050154949
- Publication date Jul 14, 2005
- LUCENT TECHNOLOGIES INC.
- Bradford G. Van Treuren
- G01 - MEASURING TESTING

Bradford G. Van Treuren

Person

Patents Grantslast 30 patents

Systems and methods for dynamic scan scheduling

Method and apparatus for position-based scheduling for JTAG systems

Method and apparatus for deferred scheduling for JTAG systems

Method and apparatus for system testing using multiple processors

Method and apparatus for virtual in-circuit emulation

Method and apparatus for system testing using multiple instruction...

Method and apparatus for providing scan chain security

Distributed base station test bus architecture in a wireless network

Method and apparatus for describing components adapted for dynamica...

Method and apparatus for describing and testing a system-on-chip

Apparatus and method for isolating portions of a scan path of a sys...

Apparatus and method for controlling dynamic modification of a scan...

Method and apparatus for describing parallel access to a system-on-...

Circuit board testing system using free space optical communications

Test vector manager, method of managing test vectors and a test too...

System and method for adaptable testing of backplane interconnectio...

System for flexible embedded Boundary Scan testing

Method and system for testing cluster circuits in a boundary scan e...

Arrangement for fault detection in circuit interconnections

Method for improving robot accuracy

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR DYNAMIC SCAN SCHEDULING

METHOD AND APPARATUS FOR POSITION-BASED SCHEDULING FOR JTAG SYSTEMS

METHOD AND APPARATUS FOR SYSTEM TESTING USING MULTIPLE INSTRUCTION...

APPARATUS AND METHOD FOR CONTROLLING DYNAMIC MODIFICATION OF A SCAN...

Apparatus and Method for Isolating Portions of a Scan Path of a Sys...

Circuit board testing system

Method and Apparatus for Describing Components Adapted for Dynamica...

Test vector manager, method of managing test vectors and a test too...

System and method for adaptable testing of backplane interconnectio...

System and method for emulating hardware failures and method of tes...

Distributed base station test bus architecture in a wireless network

System for flexible embedded Boundary Scan testing