Bradley D. Pace

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Fort Collins, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing integrated circuit devices
- Patent number 6,392,423
- Issue date May 21, 2002
- Agilent Technologies, Inc.
- Bradley D. Pace
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing integrated circuit devices
- Patent number 6,285,200
- Issue date Sep 4, 2001
- Agilent Technologies, Inc.
- Bradley D. Pace
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for testing integrated circuit devices
- Publication number 20010019275
- Publication date Sep 6, 2001
- Bradley D. Pace
- G01 - MEASURING TESTING