Bradley D. Sucher

Person

Murphy, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Process enhancement using double sided epitaxial on substrate
- Patent number 11,056,490
- Issue date Jul 6, 2021
- Texas Instruments Incorporated
- James Fred Salzman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anneal after trench sidewall implant to reduce defects
- Patent number 10,438,837
- Issue date Oct 8, 2019
- Texas Instruments Incorporated
- Bradley David Sucher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of isolation layers using a dry-wet-dry oxidation technique
- Patent number 10,304,721
- Issue date May 28, 2019
- Texas Instruments Incorporated
- Bradley David Sucher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process enhancement using double sided epitaxial on substrate
- Patent number 10,304,827
- Issue date May 28, 2019
- Texas Instruments Incorporated
- James Fred Salzman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anneal after trench sidewall implant to reduce defects
- Patent number 10,032,663
- Issue date Jul 24, 2018
- Texas Instruments Incorporated
- Bradley David Sucher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process enhancement using double sided epitaxial on substrate
- Patent number 10,002,870
- Issue date Jun 19, 2018
- Texas Instruments Incorporated
- James Fred Salzman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS-based thermopile with reduced thermal conductance
- Patent number 9,853,086
- Issue date Dec 26, 2017
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS-based thermopile with reduced thermal conductance
- Patent number 9,496,313
- Issue date Nov 15, 2016
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerated furnace ramp rates for reduced slip
- Patent number 8,759,198
- Issue date Jun 24, 2014
- Texas Instruments Incorporated
- Bradley David Sucher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal budget optimization for yield enhancement on bulk silicon w...
- Patent number 8,753,961
- Issue date Jun 17, 2014
- Texas Instruments Incorporated
- Bradley David Sucher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device having improved tran...
- Patent number 8,053,324
- Issue date Nov 8, 2011
- Texas Instruments Incorporated
- Bradley D. Sucher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Versatile system for charge dissipation in the formation of semicon...
- Patent number 7,671,445
- Issue date Mar 2, 2010
- Texas Instruments Incorporated
- Weidong Tian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Versatile system for charge dissipation in the formation of semicon...
- Patent number 7,592,252
- Issue date Sep 22, 2009
- Texas Instruments Incorporated
- Weidong Tian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Versatile system for charge dissipation in the formation of semicon...
- Patent number 7,119,444
- Issue date Oct 10, 2006
- Texas Instruments Incorporated
- Weidong Tian
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROCESS ENHANCEMENT USING DOUBLE SIDED EPITAXIAL ON SUBSTRATE
- Publication number 20190296013
- Publication date Sep 26, 2019
- TEXAS INSTRUMENTS INCORPORATED
- James Fred Salzman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANNEAL AFTER TRENCH SIDEWALL IMPLANT TO REDUCE DEFECTS
- Publication number 20180342416
- Publication date Nov 29, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Bradley David SUCHER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS ENHANCEMENT USING DOUBLE SIDED EPITAXIAL ON SUBSTRATE
- Publication number 20180254272
- Publication date Sep 6, 2018
- TEXAS INSTRUMENTS INCORPORATED
- James Fred Salzman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS ENHANCEMENT USING DOUBLE SIDED EPITAXIAL ON SUBSTRATE
- Publication number 20180053764
- Publication date Feb 22, 2018
- TEXAS INSTRUMENTS INCORPORATED
- James Fred Salzman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS-BASED THERMOPILE WITH REDUCED THERMAL CONDUCTANCE
- Publication number 20170062518
- Publication date Mar 2, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS-BASED THERMOPILE WITH REDUCED THERMAL CONDUCTANCE
- Publication number 20150349022
- Publication date Dec 3, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO IMPROVE SLIP RESISTANCE OF SILICON WAFERS
- Publication number 20150187597
- Publication date Jul 2, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Bradley David SUCHER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CZOCHRALSKI SUBSTRATES HAVING REDUCED OXYGEN DONORS
- Publication number 20150118861
- Publication date Apr 30, 2015
- TEXAS INSTRUMENTS INCORPORATED
- BRADLEY DAVID SUCHER
- C30 - CRYSTAL GROWTH
Information Patent Application
ACCELERATED FURNACE RAMP RATES FOR REDUCED SLIP
- Publication number 20140045321
- Publication date Feb 13, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Bradley David SUCHER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Thermal Budget Optimization for Yield Enhancement on Bulk Silicon W...
- Publication number 20120178240
- Publication date Jul 12, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Bradley David Sucher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Manufacturing a Semiconductor Device Having Improved Tran...
- Publication number 20110129979
- Publication date Jun 2, 2011
- Texas Instruments Inc.
- Bradley D. Sucher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR RECYCLING/RECLAIMING A MONITOR WAFER
- Publication number 20100144065
- Publication date Jun 10, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Gary C. Barrett
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERSATILE SYSTEM FOR CHARGE DISSIPATION IN THE FORMATION OF SEMICON...
- Publication number 20070057247
- Publication date Mar 15, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Weidong Tian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERSATILE SYSTEM FOR CHARGE DISSIPATION IN THE FORMATION OF SEMICON...
- Publication number 20060214170
- Publication date Sep 28, 2006
- Weidong Tian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Versatile system for charge dissipation in the formation of semicon...
- Publication number 20060033173
- Publication date Feb 16, 2006
- Weidong Tian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for recycling/reclaiming a monitor wafer
- Publication number 20060009011
- Publication date Jan 12, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Gary C. Barrett
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of increasing mechanical properties of semiconductor substrates
- Publication number 20040110013
- Publication date Jun 10, 2004
- Karl J. Yoder
- H01 - BASIC ELECTRIC ELEMENTS

Bradley D. Sucher

Person

Patents Grantslast 30 patents

Process enhancement using double sided epitaxial on substrate

Anneal after trench sidewall implant to reduce defects

Formation of isolation layers using a dry-wet-dry oxidation technique

Process enhancement using double sided epitaxial on substrate

Anneal after trench sidewall implant to reduce defects

Process enhancement using double sided epitaxial on substrate

CMOS-based thermopile with reduced thermal conductance

CMOS-based thermopile with reduced thermal conductance

Accelerated furnace ramp rates for reduced slip

Thermal budget optimization for yield enhancement on bulk silicon w...

Method of manufacturing a semiconductor device having improved tran...

Versatile system for charge dissipation in the formation of semicon...

Versatile system for charge dissipation in the formation of semicon...

Versatile system for charge dissipation in the formation of semicon...

Patents Applicationslast 30 patents

PROCESS ENHANCEMENT USING DOUBLE SIDED EPITAXIAL ON SUBSTRATE

ANNEAL AFTER TRENCH SIDEWALL IMPLANT TO REDUCE DEFECTS

PROCESS ENHANCEMENT USING DOUBLE SIDED EPITAXIAL ON SUBSTRATE

PROCESS ENHANCEMENT USING DOUBLE SIDED EPITAXIAL ON SUBSTRATE

CMOS-BASED THERMOPILE WITH REDUCED THERMAL CONDUCTANCE

CMOS-BASED THERMOPILE WITH REDUCED THERMAL CONDUCTANCE

METHOD TO IMPROVE SLIP RESISTANCE OF SILICON WAFERS

CZOCHRALSKI SUBSTRATES HAVING REDUCED OXYGEN DONORS

ACCELERATED FURNACE RAMP RATES FOR REDUCED SLIP

Thermal Budget Optimization for Yield Enhancement on Bulk Silicon W...

Method of Manufacturing a Semiconductor Device Having Improved Tran...

METHOD FOR RECYCLING/RECLAIMING A MONITOR WAFER

VERSATILE SYSTEM FOR CHARGE DISSIPATION IN THE FORMATION OF SEMICON...

VERSATILE SYSTEM FOR CHARGE DISSIPATION IN THE FORMATION OF SEMICON...

Versatile system for charge dissipation in the formation of semicon...

Method for recycling/reclaiming a monitor wafer

Method of increasing mechanical properties of semiconductor substrates