Bradley L. Quist

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Lakeville, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for backlighting and imaging multiple views of...
- Patent number 7,154,596
- Issue date Dec 26, 2006
- Bradley L. Quist
- G01 - MEASURING TESTING
Information Patent Grant
Co-planarity examination method and optical module for electronic c...
- Patent number 7,012,682
- Issue date Mar 14, 2006
- Bradley L. Quist
- G01 - MEASURING TESTING
Information Patent Grant
Co-planarity and top-down examination method and optical module for...
- Patent number 6,813,016
- Issue date Nov 2, 2004
- PPT Vision, Inc.
- Bradley L. Quist
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for backlighting and imaging multiple views of...
- Publication number 20060152741
- Publication date Jul 13, 2006
- Bradley L. Quist
- G01 - MEASURING TESTING
Information Patent Application
Co-planarity examination method and optical module for electronic c...
- Publication number 20040227959
- Publication date Nov 18, 2004
- Bradley L. Quist
- G01 - MEASURING TESTING
Information Patent Application
Co-planarity and top-down examination method and optical module for...
- Publication number 20030174318
- Publication date Sep 18, 2003
- Bradley L. Quist
- G01 - MEASURING TESTING