Bradley RIES

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Characterization system and method with guided defect discovery
- Patent number 12,062,165
- Issue date Aug 13, 2024
- KLA Corporation
- Bradley Ries
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Context-based defect inspection
- Patent number 11,922,619
- Issue date Mar 5, 2024
- KLA Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterization system and method with guided defect discovery
- Patent number 11,256,967
- Issue date Feb 22, 2022
- KLA Corporation
- Bradley Ries
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Super-resolution defect review image generation through generative...
- Patent number 10,949,964
- Issue date Mar 16, 2021
- KLA Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Feature selection and automated process window monitoring through o...
- Patent number 10,365,639
- Issue date Jul 30, 2019
- KLA-Tencor Corporation
- Shabnam Ghadar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer and lot based hierarchical method combining customized metric...
- Patent number 10,290,088
- Issue date May 14, 2019
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated inline inspection and metrology using shadow-gram images
- Patent number 9,734,568
- Issue date Aug 15, 2017
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated image-based process monitoring and control
- Patent number 9,569,834
- Issue date Feb 14, 2017
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CONTEXT-BASED DEFECT INSPECTION
- Publication number 20230316500
- Publication date Oct 5, 2023
- KLA Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Characterization System and Method With Guided Defect Discovery
- Publication number 20220172497
- Publication date Jun 2, 2022
- KLA Corporation
- Bradley Ries
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Characterization System and Method With Guided Defect Discovery
- Publication number 20210232872
- Publication date Jul 29, 2021
- KLA Corporation
- Bradley Ries
- G01 - MEASURING TESTING
Information Patent Application
Super-Resolution Defect Review Image Generation Through Generative...
- Publication number 20200098101
- Publication date Mar 26, 2020
- KLA-Tencor Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FEATURE SELECTION AND AUTOMATED PROCESS WINDOW MONITORING THROUGH O...
- Publication number 20170192411
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Shabnam Ghadar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED IMAGE-BASED PROCESS MONITORING AND CONTROL
- Publication number 20160371826
- Publication date Dec 22, 2016
- KLA-Tencor Corporation
- Himanshu VAJARIA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED INLINE INSPECTION AND METROLOGY USING SHADOW-GRAM IMAGES
- Publication number 20150243018
- Publication date Aug 27, 2015
- KLA-Tencor Corporation
- Himanshu VAJARIA
- G01 - MEASURING TESTING
Information Patent Application
Wafer and Lot Based Hierarchical Method Combining Customized Metric...
- Publication number 20150234379
- Publication date Aug 20, 2015
- KLA-Tencor Corporation
- Himanshu Vajaria
- H01 - BASIC ELECTRIC ELEMENTS

Bradley RIES

Person

Patents Grantslast 30 patents

Characterization system and method with guided defect discovery

Context-based defect inspection

Characterization system and method with guided defect discovery

Super-resolution defect review image generation through generative...

Feature selection and automated process window monitoring through o...

Wafer and lot based hierarchical method combining customized metric...

Automated inline inspection and metrology using shadow-gram images

Automated image-based process monitoring and control

Patents Applicationslast 30 patents

CONTEXT-BASED DEFECT INSPECTION

Characterization System and Method With Guided Defect Discovery

Characterization System and Method With Guided Defect Discovery

Super-Resolution Defect Review Image Generation Through Generative...

FEATURE SELECTION AND AUTOMATED PROCESS WINDOW MONITORING THROUGH O...

AUTOMATED IMAGE-BASED PROCESS MONITORING AND CONTROL

AUTOMATED INLINE INSPECTION AND METROLOGY USING SHADOW-GRAM IMAGES

Wafer and Lot Based Hierarchical Method Combining Customized Metric...