Membership
Tour
Register
Log in
Bradley RIES
Follow
Person
San Jose, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Context-based defect inspection
Patent number
11,922,619
Issue date
Mar 5, 2024
KLA Corporation
Brian Duffy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Characterization system and method with guided defect discovery
Patent number
11,256,967
Issue date
Feb 22, 2022
KLA Corporation
Bradley Ries
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Super-resolution defect review image generation through generative...
Patent number
10,949,964
Issue date
Mar 16, 2021
KLA Corporation
Anuj Pandey
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Feature selection and automated process window monitoring through o...
Patent number
10,365,639
Issue date
Jul 30, 2019
KLA-Tencor Corporation
Shabnam Ghadar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer and lot based hierarchical method combining customized metric...
Patent number
10,290,088
Issue date
May 14, 2019
KLA-Tencor Corporation
Himanshu Vajaria
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated inline inspection and metrology using shadow-gram images
Patent number
9,734,568
Issue date
Aug 15, 2017
KLA-Tencor Corporation
Himanshu Vajaria
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated image-based process monitoring and control
Patent number
9,569,834
Issue date
Feb 14, 2017
KLA-Tencor Corporation
Himanshu Vajaria
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
CONTEXT-BASED DEFECT INSPECTION
Publication number
20230316500
Publication date
Oct 5, 2023
KLA Corporation
Brian Duffy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Characterization System and Method With Guided Defect Discovery
Publication number
20220172497
Publication date
Jun 2, 2022
KLA Corporation
Bradley Ries
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Characterization System and Method With Guided Defect Discovery
Publication number
20210232872
Publication date
Jul 29, 2021
KLA Corporation
Bradley Ries
G01 - MEASURING TESTING
Information
Patent Application
Super-Resolution Defect Review Image Generation Through Generative...
Publication number
20200098101
Publication date
Mar 26, 2020
KLA-Tencor Corporation
Anuj Pandey
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FEATURE SELECTION AND AUTOMATED PROCESS WINDOW MONITORING THROUGH O...
Publication number
20170192411
Publication date
Jul 6, 2017
KLA-Tencor Corporation
Shabnam Ghadar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATED IMAGE-BASED PROCESS MONITORING AND CONTROL
Publication number
20160371826
Publication date
Dec 22, 2016
KLA-Tencor Corporation
Himanshu VAJARIA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATED INLINE INSPECTION AND METROLOGY USING SHADOW-GRAM IMAGES
Publication number
20150243018
Publication date
Aug 27, 2015
KLA-Tencor Corporation
Himanshu VAJARIA
G01 - MEASURING TESTING
Information
Patent Application
Wafer and Lot Based Hierarchical Method Combining Customized Metric...
Publication number
20150234379
Publication date
Aug 20, 2015
KLA-Tencor Corporation
Himanshu Vajaria
H01 - BASIC ELECTRIC ELEMENTS