Bradley Scot Levin

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Techniques for adjusting a beam pattern in a LIDAR system
- Patent number 12,055,636
- Issue date Aug 6, 2024
- Aeva, Inc.
- Cameron Howard
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for scan pattern beam alignment
- Patent number 11,927,701
- Issue date Mar 12, 2024
- Aeva, Inc.
- Keith Gagne
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for adjusting an optical beam trajectory
- Patent number 11,809,059
- Issue date Nov 7, 2023
- Aeva, Inc.
- Bradley Scot Levin
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for beam pattern adjustments in a LIDAR system
- Patent number 11,675,085
- Issue date Jun 13, 2023
- Aeva, Inc.
- Cameron Howard
- G01 - MEASURING TESTING
Information Patent Grant
Optical alignment for beam correction
- Patent number 11,360,198
- Issue date Jun 14, 2022
- Aeva, Inc.
- Keith Gagne
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for beam patterning optics
- Patent number 11,333,949
- Issue date May 17, 2022
- AEVA, INC.
- Bradley Scot Levin
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUES FOR ASSEMBLING "LIDAR ON A CHIP" TO MINIMIZE MECHANICAL...
- Publication number 20240319339
- Publication date Sep 26, 2024
- Aeva, Inc.
- Cameron Howard
- G01 - MEASURING TESTING
Information Patent Application
TOTAL INTERNAL REFLECTION (TIR) SCANNING DEVICE
- Publication number 20240255641
- Publication date Aug 1, 2024
- Aeva, Inc.
- Cameron Howard
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR ALIGNMENT OF TARGET AND LOCAL OSCILLATOR BEAMS TO PH...
- Publication number 20240255722
- Publication date Aug 1, 2024
- Aeva, Inc.
- Kevin Larson Pollock
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR SCAN PATTERN BEAM ALIGNMENT
- Publication number 20240248187
- Publication date Jul 25, 2024
- Aeva, Inc.
- Keith Gagne
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR ADJUSTING A BEAM PATTERN IN A LIDAR SYSTEM
- Publication number 20240142626
- Publication date May 2, 2024
- Aeva, Inc.
- Cameron Howard
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR ADJUSTING AN OPTICAL BEAM TRAJECTORY
- Publication number 20230125665
- Publication date Apr 27, 2023
- Aeva, Inc.
- Bradley Scot Levin
- G02 - OPTICS
Information Patent Application
TECHNIQUES FOR SCAN PATTERN BEAM ALIGNMENT
- Publication number 20230100452
- Publication date Mar 30, 2023
- Aeva, Inc.
- Keith Gagne
- G01 - MEASURING TESTING