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Brandon Gregory Greiner
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Fort Collins, CO, US
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last 30 patents
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Patent Grant
Temperature measurement of an integrated circuit
Patent number
7,648,270
Issue date
Jan 19, 2010
Avago Technologies General IP (Singapore) Pte. Ltd.
Fouad A. Faour
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Temperature measurement of an integrated circuit
Publication number
20050220171
Publication date
Oct 6, 2005
Fouad A. Faour
G01 - MEASURING TESTING