Brandon R. Kam

Follow

Person

Waipahu, HI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit and method for on-chip jitter measurement
- Patent number 8,385,394
- Issue date Feb 26, 2013
- International Business Machines Corporation
- Brandon R. Kam
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for on-chip jitter measurement
- Patent number 8,126,041
- Issue date Feb 28, 2012
- International Business Machines Corporation
- Brandon R. Kam
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for on-chip jitter measurement
- Patent number 7,339,364
- Issue date Mar 4, 2008
- International Business Machines Corporation
- Brandon R. Kam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT AND METHOD FOR ON-CHIP JITTER MEASUREMENT
- Publication number 20120134403
- Publication date May 31, 2012
- International Business Machines Corporation
- Brandon R. Kam
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT AND METHOD FOR ON-CHIP JITTER MEASUREMENT
- Publication number 20090102452
- Publication date Apr 23, 2009
- Brandon R. Kam
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT AND METHOD FOR ON-CHIP JITTER MEASUREMENT
- Publication number 20080012549
- Publication date Jan 17, 2008
- Brandon R. Kam
- H03 - BASIC ELECTRONIC CIRCUITRY