Brandon Roth

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for automatically calibrating a temperature sensor
- Patent number 9,810,589
- Issue date Nov 7, 2017
- Micron Technology, Inc.
- Manoj Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Locked-loop quiescence apparatus, systems, and methods
- Patent number 9,444,469
- Issue date Sep 13, 2016
- Micron Technology, Inc.
- Eric Becker
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and methods for delay line testing
- Patent number 9,335,372
- Issue date May 10, 2016
- Micron Technology, Inc.
- Scott Van De Graaff
- G01 - MEASURING TESTING
Information Patent Grant
System and method for automatically calibrating a temperature sensor
- Patent number 8,862,421
- Issue date Oct 14, 2014
- Micron Technology, Inc.
- Manoj Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Locked-loop quiescence apparatus, systems, and methods
- Patent number 8,754,683
- Issue date Jun 17, 2014
- Micron Technology, Inc.
- Eric Becker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for automatically calibrating a temperature sensor
- Patent number 7,809,519
- Issue date Oct 5, 2010
- Micron Technology, Inc.
- Manoj Sinha
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY CALIBRATING A TEMPERATURE SENSOR
- Publication number 20150023386
- Publication date Jan 22, 2015
- Micron Technology, Inc.
- Manoj Sinha
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR DELAY LINE TESTING
- Publication number 20140375329
- Publication date Dec 25, 2014
- Scott Van De Graaff
- G01 - MEASURING TESTING
Information Patent Application
LOCKED-LOOP QUIESCENCE APPARATUS, SYSTEMS, AND METHODS
- Publication number 20140292389
- Publication date Oct 2, 2014
- Eric Becker
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY CALIBRATING A TEMPERATURE SENSOR
- Publication number 20110019713
- Publication date Jan 27, 2011
- Micron Technology, Inc.
- Manoj Sinha
- G01 - MEASURING TESTING
Information Patent Application
LOCKED-LOOP QUIESCENCE APPARATUS, SYSTEMS, AND METHODS
- Publication number 20090315600
- Publication date Dec 24, 2009
- Micron Technologies, Inc.
- Eric Becker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System and method for automatically calibrating a temperature sensor
- Publication number 20070014329
- Publication date Jan 18, 2007
- Manoj Sinha
- G01 - MEASURING TESTING
Information Patent Application
Delay-lock loop and method having high resolution and wide dynamic...
- Publication number 20060214710
- Publication date Sep 28, 2006
- Tyler Gomm
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Delay-lock loop and method having high resolution and wide dynamic...
- Publication number 20060044032
- Publication date Mar 2, 2006
- Tyler Gomm
- H03 - BASIC ELECTRONIC CIRCUITRY

Brandon Roth

Person

Patents Grantslast 30 patents

System and method for automatically calibrating a temperature sensor

Locked-loop quiescence apparatus, systems, and methods

Apparatus and methods for delay line testing

System and method for automatically calibrating a temperature sensor

Locked-loop quiescence apparatus, systems, and methods

System and method for automatically calibrating a temperature sensor

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR AUTOMATICALLY CALIBRATING A TEMPERATURE SENSOR

APPARATUS AND METHODS FOR DELAY LINE TESTING

LOCKED-LOOP QUIESCENCE APPARATUS, SYSTEMS, AND METHODS

SYSTEM AND METHOD FOR AUTOMATICALLY CALIBRATING A TEMPERATURE SENSOR

LOCKED-LOOP QUIESCENCE APPARATUS, SYSTEMS, AND METHODS

System and method for automatically calibrating a temperature sensor

Delay-lock loop and method having high resolution and wide dynamic...

Delay-lock loop and method having high resolution and wide dynamic...