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Brandon T. MOTES
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Rowlett, TX, US
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last 30 patents
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Patent Application
Automated Optical Measurement System To Determine Semiconductor Pro...
Publication number
20230304944
Publication date
Sep 28, 2023
Massachusetts Institute of Technology
Anthony T. TROUPE
G01 - MEASURING TESTING
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Patent Application
Prediction Of Semiconductor Device Performance
Publication number
20230268236
Publication date
Aug 24, 2023
Massachusetts Institute of Technology
Dane William DEQUILETTES
H01 - BASIC ELECTRIC ELEMENTS