Branislav Straka

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for beam position visualization
- Patent number 10,998,166
- Issue date May 4, 2021
- FEI Company
- Branislav Straka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS OF ELECTRON DIFFRACTION
- Publication number 20250112022
- Publication date Apr 3, 2025
- FEI Company
- Jakub HOLZER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR ORIENTATING A SAMPLE FOR INSPECTION WITH CHAR...
- Publication number 20250110069
- Publication date Apr 3, 2025
- FEI Company
- Radovan VAŠINA
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED DETECTOR FOR CHARGED PARTICLE MICROSCOPY
- Publication number 20250069844
- Publication date Feb 27, 2025
- FEI Company
- Petr Hlavenka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Alignment Free Ion Column
- Publication number 20240222067
- Publication date Jul 4, 2024
- FEI Company
- Radek Smolka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SENSORS INCLUDING WIDE BANDGAP MATERIALS
- Publication number 20240194442
- Publication date Jun 13, 2024
- FEI Company
- Branislav Straka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR BEAM POSITION VISUALIZATION
- Publication number 20210035775
- Publication date Feb 4, 2021
- FEI Company
- Branislav Straka
- H01 - BASIC ELECTRIC ELEMENTS

Branislav Straka

Person

Patents Grantslast 30 patents

System and method for beam position visualization

Patents Applicationslast 30 patents

METHODS AND SYSTEMS OF ELECTRON DIFFRACTION

METHOD AND SYSTEM FOR ORIENTATING A SAMPLE FOR INSPECTION WITH CHAR...

SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS

SHIELDED DETECTOR FOR CHARGED PARTICLE MICROSCOPY

Method for Alignment Free Ion Column

CHARGED PARTICLE SENSORS INCLUDING WIDE BANDGAP MATERIALS

SYSTEM AND METHOD FOR BEAM POSITION VISUALIZATION