Branko Bukal

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Toronto, CA

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for optical inspection of a display
- Patent number 7,308,157
- Issue date Dec 11, 2007
- Photon Dynamics, Inc.
- Reza Safaee-Rad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test and alignment system for electronic display devices
- Patent number 6,252,626
- Issue date Jun 26, 2001
- Image Processing Systems, Inc.
- Eric S. Buckley
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electron beam profile measurement method and system
- Patent number 6,058,221
- Issue date May 2, 2000
- Image Processing Systems, Inc.
- Branko Bukal
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test and alignment system for electronic display devices and test f...
- Patent number 5,969,756
- Issue date Oct 19, 1999
- Image Processing Systems Inc.
- Eric Buckley
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for optical inspection of a display
- Publication number 20040213449
- Publication date Oct 28, 2004
- Photon Dynamics, Inc.
- Reza Safaee-Rad
- G06 - COMPUTING CALCULATING COUNTING