Brazel G. Preece

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Vancouver, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for isolation of wafer support-related crystal defects
- Patent number 6,825,487
- Issue date Nov 30, 2004
- SEH America, Inc.
- Brazel G. Preece
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for isolation of wafer support-related crystal defects
- Publication number 20040021097
- Publication date Feb 5, 2004
- SEH America, Inc.
- Brazel G. Preece
- G01 - MEASURING TESTING